An adaptive multi-element probabilistic collocation method for statistical EMC/EMI characterization

IEEE Transactions on Electromagnetic Compatibility

Volumn 55, Issue 6, 2013, Pages 1154-1168

  Yücel, Abdulkadir C ^a   Baǧci, Hakan ^b   Michielssen, Eric ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Saudi Arabia)

Author keywords

Adaptive algorithm; Electromagnetic compatibility and interference (EMC EMI); Generalized polynomial chaos (gPC); Multi dimensional integral; Multi element (ME); Probabilistic collocation (PC); Sparse grid (SG); Tensor product (TP); Tolerance analysis; Uncertainty quantification

Indexed keywords

EMC/EMI; GENERALIZED POLYNOMIAL CHAOS (GPC); MULTI-DIMENSIONAL INTEGRAL; MULTI-ELEMENT; PROBABILISTIC COLLOCATIONS; SPARSE GRID; TENSOR PRODUCTS; TOLERANCE ANALYSIS; UNCERTAINTY QUANTIFICATIONS;

ADAPTIVE ALGORITHMS; DECAY (ORGANIC); ELECTROMAGNETIC COMPATIBILITY; EXCITED STATES; FITS AND TOLERANCES; MONTE CARLO METHODS; POLYNOMIALS; PROBABILITY DENSITY FUNCTION; RANDOM VARIABLES;

CHARACTERIZATION;

EID: 84890438047     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2013.2265047     Document Type: Article

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