Revealing the relationship between semiconductor electronic structure and electron transfer dynamics at metal oxide-chromophore interfaces

Journal of Physical Chemistry C

Volumn 117, Issue 48, 2013, Pages 25259-25268

  Knauf, Robin R ^a   Brennaman, M Kyle ^a   Alibabaei, Leila ^a   Norris, Michael R ^a   Dempsey, Jillian L ^a  

^a The University of North Carolina at Chapel Hill   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACK ELECTRON TRANSFER; CHARGE RECOMBINATIONS; ELECTRON TRANSFER DYNAMICS; EXPONENTIAL DISTRIBUTIONS; NANOCRYSTALLINE THIN FILMS; NANOSECOND TRANSIENT ABSORPTION; SEMICONDUCTOR ELECTRONICS; VOLTAMMETRY MEASUREMENTS;

CYCLIC VOLTAMMETRY; ELECTRON TRANSITIONS; ELECTRONIC STRUCTURE; METALLIC COMPOUNDS; OXIDE FILMS; TITANIUM DIOXIDE;

CHROMOPHORES;

EID: 84890400122     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp407587r     Document Type: Article

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