Determination of electronic and atomic properties of surface, bulk and buried interfaces: Simultaneous combination of hard X-ray photoelectron spectroscopy and X-ray diffraction

Journal of Electron Spectroscopy and Related Phenomena

Volumn 190, Issue PART B, 2013, Pages 205-209

  Rubio Zuazo, J ^a,b   Castro, G R ^a,b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Electronic and compositional depth profiles; HAXPES; La Ca mixed valence manganites; Surface and bulk X ray diffraction

Indexed keywords

COMPOSITIONAL DEPTH PROFILE; CRYSTALLOGRAPHIC STRUCTURE; EUROPEAN SYNCHROTRON RADIATION FACILITIES; GRAZING-INCIDENCE X-RAY DIFFRACTION; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; HAX-PES; MIXED-VALENCE MANGANITE; PHOTOELECTRON KINETIC ENERGY;

ELECTRON GUNS; ELECTRONIC PROPERTIES; KINETIC ENERGY; KINETICS; PHOTONS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

PHOTOELECTRONS;

EID: 84890129319     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2013.04.003     Document Type: Article

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