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Volumn 47, Issue 23, 2013, Pages 13594-13601

Complex refractive indices of thin films of secondary organic materials by spectroscopic ellipsometry from 220 to 1200 nm

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC PARTICLES; COMPLEX REFRACTIVE INDEX; ELECTROSTATIC PRECIPITATION; REAL AND IMAGINARY; SILICON SUBSTRATES; SINGLE-SCATTERING ALBEDO; SPECTROSCOPIC ELLIPSOMETERS; WAVELENGTH DEPENDENCE;

EID: 84889781446     PISSN: 0013936X     EISSN: 15205851     Source Type: Journal    
DOI: 10.1021/es403411e     Document Type: Article
Times cited : (73)

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