In Situ Diagnostics by High-Pressure RHEED During PLD

Pulsed Laser Deposition of Thin Films: Applications-Led Growth of Functional Materials

Volumn , Issue , 2006, Pages 85-97

  Rijnders, Guus ^a   Blank, Dave H A ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

In situ diagnostics by high pressure RHEED in PLD; Reflection high energy electron diffraction (RHEED) in surface science; RHEED and low pressure thin film growth techniques

Indexed keywords

EID: 84889393657     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9780470052129.ch4     Document Type: Chapter

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