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Volumn 38, Issue 1-2 SPEC. ISS., 1996, Pages 33-51

ESD: Waveform calculation, field and current of human and simulator ESD

Author keywords

Current; ESD; Simulation; Transient fields

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTRIC FIELDS; ELECTROSTATICS; MATHEMATICAL MODELS; TRANSIENTS; WAVEFORM ANALYSIS;

EID: 0030262021     PISSN: 03043886     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0304-3886(96)00028-9     Document Type: Article
Times cited : (88)

References (30)
  • 3
    • 0043031544 scopus 로고
    • ESD-immunity testing of IEC 801-2. The reproducibility of the test results evaluated from a statistical point of view
    • E. Habiger, ESD-immunity testing of IEC 801-2. The reproducibility of the test results evaluated from a statistical point of view, Int. Zürch Symp. on EMC (1995) pp. 645-648.
    • (1995) Int. Zürch Symp. on EMC , pp. 645-648
    • Habiger, E.1
  • 4
    • 0028742531 scopus 로고
    • Tests with different IEC 801.2 ESD simulators have different results
    • K. Hall, Tests with different IEC 801.2 ESD simulators have different results, EOS/ESD Symp., (1994) pp. 161-163.
    • (1994) EOS/ESD Symp. , pp. 161-163
    • Hall, K.1
  • 5
    • 0028752364 scopus 로고
    • Transient fields of ESD
    • D. Pommerenke, Transient fields of ESD, EOS/ESD Symp. 1994, pp. 150-159.
    • (1994) EOS/ESD Symp. , pp. 150-159
    • Pommerenke, D.1
  • 6
    • 0041528635 scopus 로고
    • Check ESD simulators for radiated EMI
    • June
    • M. Rowe, Check ESD simulators for radiated EMI, Test & Measurement World (June 1995) 15.
    • (1995) Test & Measurement World , pp. 15
    • Rowe, M.1
  • 7
    • 0042530624 scopus 로고
    • Think before shielding your ESD simulator
    • November
    • M. Hopkins, Think before shielding your ESD simulator, Test & Measurement World (November 1995) 31-32.
    • (1995) Test & Measurement World , pp. 31-32
    • Hopkins, M.1
  • 9
    • 0029405976 scopus 로고
    • ESD: Transient fields, arc simulation and rise time limit
    • D. Pommerenke, ESD: transient fields, arc simulation and rise time limit, J. Electrostatics, 36 (1995) 31-54.
    • (1995) J. Electrostatics , vol.36 , pp. 31-54
    • Pommerenke, D.1
  • 10
    • 0027882745 scopus 로고
    • A new type of furniture ESD and its implications
    • D. Smith, A new type of furniture ESD and its implications, EOS/ESD Symposium (1993) 3-8.
    • (1993) EOS/ESD Symposium , pp. 3-8
    • Smith, D.1
  • 11
    • 0043031543 scopus 로고    scopus 로고
    • Data provided by Hugh Hyatt at the February standardization committee meeting of the EOS/ESD Association
    • H. Hyatt, Data provided by Hugh Hyatt at the February standardization committee meeting of the EOS/ESD Association.
    • Hyatt, H.1
  • 12
    • 0042530625 scopus 로고
    • Interception and refinement of equipment ESD testing
    • W.T. Rhoades, Interception and refinement of equipment ESD testing, Int. Zürich Symp. on EMC (1991) 419-424.
    • (1991) Int. Zürich Symp. on EMC , pp. 419-424
    • Rhoades, W.T.1
  • 13
  • 14
    • 0027867742 scopus 로고
    • Improved statistical method for system-level ESD tests
    • R. Renninger, Improved statistical method for system-level ESD tests, IEEE Int. Symp. on EMC (1993) 20-25.
    • (1993) IEEE Int. Symp. on EMC , pp. 20-25
    • Renninger, R.1
  • 15
    • 0025545231 scopus 로고
    • Dynamics calibration of waveform recorders and oscilloscopes using pule standards
    • December
    • W.L. Gans, Dynamics calibration of waveform recorders and oscilloscopes using pule standards, IEEE Trans. Instr. Meas., 39 (December 1990) 952-957.
    • (1990) IEEE Trans. Instr. Meas. , vol.39 , pp. 952-957
    • Gans, W.L.1
  • 17
    • 0043031546 scopus 로고
    • Travelling-wave fast transient ESD simulation
    • K.G. Balmain and F. Rayal, Travelling-wave fast transient ESD simulation, IEEE Int. Symp. on EMC (1992) 455-459.
    • (1992) IEEE Int. Symp. on EMC , pp. 455-459
    • Balmain, K.G.1    Rayal, F.2
  • 19
    • 0002873502 scopus 로고
    • 6 GHz time domain measurement of fast transient events
    • R. Wallace, 6 GHz time domain measurement of fast transient events, IEEE Int. Symp. on EMC (1992) 460-463.
    • (1992) IEEE Int. Symp. on EMC , pp. 460-463
    • Wallace, R.1
  • 20
    • 0041528632 scopus 로고
    • The resistive phase of an air discharge and the formation of fast risetime ESD pulses
    • H.M. Hyatt, The resistive phase of an air discharge and the formation of fast risetime ESD pulses, EOS/ESD Symp. (1992) 55-67.
    • (1992) EOS/ESD Symp. , pp. 55-67
    • Hyatt, H.M.1
  • 21
    • 0042029834 scopus 로고
    • Dielectric properties of biological systems
    • paper OK2
    • C. Gabriel, Dielectric properties of biological systems, Int. Zürich Symp. on EMC (1995) supplement, paper OK2.
    • (1995) Int. Zürich Symp. on EMC , Issue.SUPPL.
    • Gabriel, C.1
  • 22
    • 0003554146 scopus 로고
    • Mathworks Inc., South Nateck, MA
    • MATLAB User's guide, Mathworks Inc., South Nateck, MA, 1990.
    • (1990) MATLAB User's Guide
  • 25
    • 0043031545 scopus 로고
    • ESD guns that don't shoot straight
    • October San Francisco, CA
    • D. McCarthy, ESD guns that don't shoot straight, Presented at the IEC TC77 working group meeting, October 1994, San Francisco, CA.
    • (1994) IEC TC77 Working Group Meeting
    • McCarthy, D.1
  • 27
    • 0028580035 scopus 로고
    • Measurements of fast transient electric fields in the vicinity of short gap discharges
    • Sendai, Japan
    • S. Ishigami and I. Yokoshima, Measurements of fast transient electric fields in the vicinity of short gap discharges, EMC'94, Sendai, Japan (1994) 90-93.
    • (1994) EMC'94 , pp. 90-93
    • Ishigami, S.1    Yokoshima, I.2
  • 28
    • 0042029838 scopus 로고
    • Dissertation at the Technical University Berlin, VDI Fortschrittsberichte, Reihe 21 (Elektrotechnik)
    • D. Pommerenke, Dissertation at the Technical University Berlin, VDI Fortschrittsberichte, Reihe 21 (Elektrotechnik) 1995.
    • (1995)
    • Pommerenke, D.1
  • 29
    • 84916579350 scopus 로고
    • A measurement system for transient fields caused by electrostatic discharges
    • Yokohama
    • D. Pommerenke and W. Kalkner, A measurement system for transient fields caused by electrostatic discharges, 8th Int. Symp. on High Voltage (ISH), Yokohama (1993).
    • (1993) 8th Int. Symp. on High Voltage (ISH)
    • Pommerenke, D.1    Kalkner, W.2
  • 30
    • 0025466749 scopus 로고
    • A study of the repeatability of electrostatic discharge simulators
    • J.S. Maas and D.J. Pratt, A study of the repeatability of electrostatic discharge simulators, IEEE Int. Symp. on EMC (1990) 265-269.
    • (1990) IEEE Int. Symp. on EMC , pp. 265-269
    • Maas, J.S.1    Pratt, D.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.