Invasive PUF analysis

Proceedings - 10th Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2013

Volumn , Issue , 2013, Pages 30-38

  Nedospasov, Dmitry ^a   Seifert, Jean Pierre ^a   Helfmeier, Clemens ^a   Boit, Christian ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Fully invasive; IC security; Laser characterization; PUF; Semi invasive; Tamper evidence

Indexed keywords

FULLY-INVASIVE; LASER CHARACTERIZATION; PUF; SEMI-INVASIVE; TAMPER-EVIDENCE;

FAILURE ANALYSIS;

CRYPTOGRAPHY;

EID: 84889048008     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FDTC.2013.19     Document Type: Conference Paper

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