Damage threshold investigation using grazing incidence irradiation by hard X-ray free electron laser

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8848, Issue , 2013, Pages

  Koyama, T ^a   Yumoto, H ^a   Tono, K ^a   Sato, T ^b   Togashi, T ^a   Inubushi, Y ^b   Katayama, T ^a   Kim, J ^c   Matsuyama, S ^c   Mimura, H ^d   Yabashi, M ^b   Yamauchi, K ^c   Ohashi, H ^a  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b RIKEN SPring 8 Center   (Japan)

^c OSAKA UNIVERSITY   (Japan)

^d UNIVERSITY OF TOKYO   (Japan)

Author keywords

Ablation; Damage threshold; Focusing mirror; Hard X ray; X ray free electron laser

Indexed keywords

DAMAGE THRESHOLD; FOCUSING MIRRORS; GRAZING INCIDENCE; HARD X RAY; IRRADIATED SAMPLES; POWER DENSITIES; X RAY MIRRORS; X-RAY FREE ELECTRON LASERS;

ABLATION; FOCUSING; FREE ELECTRON LASERS; MIRRORS;

X RAYS;

EID: 84888870194     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2025377     Document Type: Conference Paper

References (12)

1. Emma, P. et al., "First lasing and operation of an ångstrom-wavelength free-electron laser," Nature Photon. 4, 641-647 (2010).
2. Ishikawa, T. et al., "A compact X-ray free-electron laser emitting in the sub-ångstrom region," Nature Photon. 6, 540-544 (2012).
3. Tono, K., Inubushi, Y., Sato, T., Togashi, T., Ohashi, H., Kimura, H., Takahashi, S., Takeshita, K., Tomizawa, H., Goto, S., and Yabashi, M., "Beamline for X-ray Free Electron Laser of SACLA," J. Phys. Conference Series 425, 072006 (2013).
4. Inubushi, Y., Tono, K., Togashi, T., Sato, T., Hatsui, T., Kameshima, T., Togawa, K., Hara, T., Tanaka, T., Tanaka, H., Ishikawa, T., and Yabashi, M., "Determination of the pulse duration of an X-ray free electron laser using highly resolved single-shot spectra," Phys. Rev. Lett. 109, 144801 (2012).
5. Yumoto, H., Mimura, H., Koyama, T., Matsuyama, S., Tono, K., Togashi, T., Inubushi, Y., Sato, T., Tanaka, T., Kimura, T., Yokoyama, H., Kim, J., Sano, Y., Hachisu, Y., Yabashi, M., Ohashi, H., Ohmori, H., Ishikawa, T., and Yamauchi, K., "Focusing of X-ray free electron laser with reflective optics," Nature photon. 7, 43-47 (2013).
6. Koyama, T., Yumoto, H., Senba, Y., Tono, K., Sato, T., Togashi, T., Inubushi, Y., Katayama, T., Kim, J., Matsuyama, S., Mimura, H., Yabashi, M., Yamauchi, K., Ohashi, H., and Ishikawa, T., "Investigation of ablation thresholds of optical materials using 1-μm-focusing beam at hard Xray free electron laser," Opt. Express 21, 15382 (2013).
7. Kudo, T., Hirono, T., Nagasono, M., and Yabashi, M., "Vacuum- compatible pulse selector for free-electron laser," Rev. Sci. Instrum. 80, 093301 (2009).
8. Tono, K., Kudo, T., Yabashi, M., Tachibana, T., Feng, Y., Fritz, D., Hastings, J., and Ishikawa, T., "Single-shot beam-position monitor for x-ray free electron laser," Rev. Sci. Instrum. 82, 023108 (2011).
9. Bionta, R. M., "Controlling dose to low Z solids at LCLS," LCLS Technical Note No. LCLS-TN-00-3 (2000).
10. London, R. A., and Bionta., R. M., Tatchyn, R. O., and Roesler, S., "Computational simulations of high intensity x-ray matter interaction," Proc. SPIE 4500, 51-62 (2001).
11. Yabashi, M., Higashiya, A., Tamasaku, K., Kimura, H., Kudo, T., Ohashi, H., Takahashi, S., Goto, S., and Ishikawa, T., "Optics development for Japanese XFEL project," Proc. of SPIE 6586, 658605 (2007).
12. Kobetich, E. J., and Katz, R., "Energy Deposition by Electron Beams and γ Rays," Phys. Rev. 170, 391-396 (1968).