Capability for fine tuning of the refractive index sensing properties of long-period gratings by atomic layer deposited Al2O3 overlays

Sensors (Switzerland)

Volumn 13, Issue 12, 2013, Pages 16372-16383

  Śmietana, Mateusz ^a   Myśliwiec, Marcin ^a   Mikulic, Predrag ^b   Witkowski, Bartłomiej S ^c   Bock, Wojtek J ^b  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b UNIVERSITÉ DU QUÉBEC EN OUTAOUAIS   (Canada)

^c INSTITUTE OF PHYSICS   (Poland)

Author keywords

Aluminum oxide (Al2O3); Atomic Layer Deposition (ALD); Long period gratings (LPG); Optical fiber sensors; Optical properties; Refractive index sensor; Thin films

Indexed keywords

ALUMINUM OXIDES; ATOMIC LAYER DEPOSITED; CONTROLLED DEPOSITION; LONG PERIOD GRATINGS; OPTICAL FIBER SENSOR; REFRACTIVE INDEX SENSING; REFRACTIVE INDEX SENSOR; RESONANCE WAVELENGTHS;

ALUMINUM; DEPOSITION; OPTICAL FIBERS; OPTICAL PROPERTIES; REFRACTIVE INDEX; SILICON OXIDES; THIN FILMS;

ATOMIC LAYER DEPOSITION;

EID: 84888607095     PISSN: 14248220     EISSN: None     Source Type: Journal    
DOI: 10.3390/s131216372     Document Type: Article

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