Sub-picowatt/kelvin resistive thermometry for probing nanoscale thermal transport

Review of Scientific Instruments

Volumn 84, Issue 11, 2013, Pages

  Zheng, Jianlin ^a   Wingert, Matthew C ^a   Dechaumphai, Edward ^a   Chen, Renkun ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATTENUATION EFFECT; COMMON MODE NOISE; HEAT TRANSFER PHYSICS; NANOSCALE THERMAL TRANSPORT; RESISTIVE THERMOMETRIES; TEMPERATURE RESOLUTION; THERMAL CONDUCTANCE; THERMAL TIME CONSTANTS;

NANOTECHNOLOGY;

THERMOMETERS;

EID: 84888587113     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4826493     Document Type: Article

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