Measurement of line tension on droplets in the submicrometer range

Langmuir

Volumn 29, Issue 46, 2013, Pages 14147-14153

  Heim, Lars Oliver ^a   Bonaccurso, Elmar ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALTERNATIVE CONCEPTS; ENGINEERING SCIENCE; FUNDAMENTAL RESEARCH; LIQUID DROPLETS; MICROMETER SCALE; SOLID SUBSTRATES; THREE-PHASE CONTACT LINE; YOUNG'S EQUATION;

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; IONIC LIQUIDS; MAGNETIC BUBBLES; SILICON WAFERS; SUBSTRATES; WETTING;

DROPS;

EID: 84888381870     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la402932y     Document Type: Article

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