Scanning tunneling microscopy of defect states in the semiconductor (formula presented)

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 16, 2002, Pages 1-4

  Urazhdin, S ^a   Bilc, D ^a   Tessmer, S H ^a   Mahanti, S D ^a   Kyratsi, Theodora ^a   Kanatzidis, M G ^a  

^a MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84888329252     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.66.161306     Document Type: Article

References (18)

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