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Journal of Alloys and Compounds

Volumn 587, Issue , 2014, Pages 251-254

Ta L3-edge XANES study of perovskite oxynitrides ATaO 2N (A = Ca, Sr, Ba)

(2) Paek, Seung Min b Kim, Young Il a

a Yeungnam University (South Korea)

b Kyungpook National University (South Korea)

Author keywords

Electronic properties; Neutron diffraction; Nitride materials; Semiconductors; X ray spectroscopy

Indexed keywords

ABSORPTION EDGE ENERGIES; BONDING GEOMETRY; BONDING NATURE; CONDUCTION-BAND MINIMUM; CONTINUUM TRANSITIONS; COVALENCIES; LOWER ENERGIES; NITRIDE MATERIALS;

CHEMICAL BONDS; ELECTRONEGATIVITY; ELECTRONIC PROPERTIES; NEUTRON DIFFRACTION; SEMICONDUCTOR MATERIALS; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY SPECTROSCOPY;

PEROVSKITE;

EID: 84888113297 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2013.10.155 Document Type: Article

Times cited : (13)

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