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Volumn , Issue , 1999, Pages 53-56

Development of adhesion promoters to enhance polymer/substrate interface toughness

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; FRACTURE TOUGHNESS; INTERFACES (MATERIALS); SILICON NITRIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84887957699     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAPM.1999.757286     Document Type: Conference Paper
Times cited : (6)

References (12)
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  • 2
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  • 4
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    • (1997) Application of Fracture Mechanics in Electronic PKG , pp. 33-40
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  • 5
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    • Edge liftoff: A new test for adhesion
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    • Shaffer, I.I.E.O.1    Townsend, P.2    Im, J.3
  • 7
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    • On the mechanical reliability of photo-BCB-based thin film dielectric polymer for electronic packaging applications
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  • 9
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  • 10
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.