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Optics Letters

Volumn 38, Issue 22, 2013, Pages 4845-4848

Quantitative phase imaging via Fourier ptychographic microscopy

(4) Ou, Xiaoze a Horstmeyer, Roarke a Yang, Changhuei a Zheng, Guoan a,b

a California Institute of Technology (United States)

b UNIVERSITY OF CONNECTICUT (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING MODALITY; OPTICAL COMPONENTS; OPTICAL THICKNESS; PHASE-SHIFTING DIGITAL HOLOGRAPHY; QUANTITATIVE PHASE IMAGING; RESOLUTION ENHANCEMENT; SAMPLE INFORMATION; SYSTEM'S PERFORMANCE;

OPTICS; OPTOELECTRONIC DEVICES;

COMPUTER GENERATED HOLOGRAPHY;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; EQUIPMENT FAILURE; FOURIER ANALYSIS; IMAGE ENHANCEMENT; METHODOLOGY; PHASE CONTRAST MICROSCOPY; SIGNAL PROCESSING;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; FOURIER ANALYSIS; IMAGE ENHANCEMENT; MICROSCOPY, PHASE-CONTRAST; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 84887928526 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.38.004845 Document Type: Article

Times cited : (368)

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