Effect of sol-layers on Sb-doped SnO2 thin films as solution-based transparent conductive oxides

Ceramics International

Volumn 40, Issue 1 PART A, 2014, Pages 385-391

  An, Ha Rim ^a   Kim, Changyeoul ^b   Oh, Sung Tag ^a   Ahn, Hyo Jin ^a  

^a Seoul National University of Science and Technology   (South Korea)

^b Korea Institute of Ceramic Engineering and Technology (KICET)   (South Korea)

Author keywords

A. Films; A. Microwave processing; B. Surfaces; C. Electrical properties; C. Optical properties

Indexed keywords

ANTIMONY COMPOUNDS; ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; COATINGS; CONDUCTIVE FILMS; FIELD EMISSION MICROSCOPES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; OPTICAL EMISSION SPECTROSCOPY; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SOLS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRICAL AND OPTICAL PROPERTIES; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FIGURE OF MERIT (FOM); HALL EFFECT MEASUREMENT; MICROWAVE PROCESSING; PERFORMANCE ENHANCEMENTS; TRANSPARENT CONDUCTIVE OXIDES; UV-VIS SPECTROPHOTOMETRY;

THIN FILMS;

EID: 84887621085     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2013.06.013     Document Type: Article

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