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Volumn 5, Issue 23, 2013, Pages 11885-11893
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Nanoscale structural and functional mapping of nacre by scanning probe microscopy techniques
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE ACOUSTIC MICROSCOPY;
HIERARCHICAL STRUCTURES;
NANOMECHANICAL MAPPINGS;
ORGANIC-INORGANIC INTERFACE;
PIEZOELECTRIC PROPERTY;
PIEZORESPONSE FORCE MICROSCOPY;
SCANNING PROBE MICROSCOPY TECHNIQUES;
STRUCTURE-FUNCTION RELATIONSHIP;
BIOMOLECULES;
FERROELECTRIC MATERIALS;
MAPPING;
MECHANICAL PROPERTIES;
NANOTECHNOLOGY;
PIEZOELECTRICITY;
SCANNING PROBE MICROSCOPY;
GEMS;
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EID: 84887495980
PISSN: 20403364
EISSN: 20403372
Source Type: Journal
DOI: 10.1039/c3nr02731g Document Type: Article |
Times cited : (25)
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References (55)
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