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Volumn 5, Issue 23, 2013, Pages 11885-11893

Nanoscale structural and functional mapping of nacre by scanning probe microscopy techniques

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE ACOUSTIC MICROSCOPY; HIERARCHICAL STRUCTURES; NANOMECHANICAL MAPPINGS; ORGANIC-INORGANIC INTERFACE; PIEZOELECTRIC PROPERTY; PIEZORESPONSE FORCE MICROSCOPY; SCANNING PROBE MICROSCOPY TECHNIQUES; STRUCTURE-FUNCTION RELATIONSHIP;

EID: 84887495980     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c3nr02731g     Document Type: Article
Times cited : (25)

References (55)
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    • in, ed. B. Bushan and H. Fuchs, Springer, Berlin, 97-138
    • D. C. Hurley, in Applied Scanning Probe Methods XI, ed., B. Bushan, and, H. Fuchs, Springer, Berlin, 2009, pp. 97-138
    • (2009) Applied Scanning Probe Methods XI
    • Hurley, D.C.1
  • 32
    • 13844258064 scopus 로고    scopus 로고
    • in, ed. B. Bushan and H. Fuchs, Springer-Verlag, Berlin, 37-90
    • U. Rabe, in Applied Scanning Probe Methods II, ed., B. Bushan, and, H. Fuchs, Springer-Verlag, Berlin, 2006, pp. 37-90
    • (2006) Applied Scanning Probe Methods II
    • Rabe, U.1
  • 34
    • 85040956871 scopus 로고
    • Cambridge University Press, Cambridge
    • K. L. Johnson, Contact mechanics, Cambridge University Press, Cambridge, 1985
    • (1985) Contact Mechanics
    • Johnson, K.L.1
  • 46
    • 0004076443 scopus 로고    scopus 로고
    • in, Wiley-VCH, Weinheim, 3rd edn, 293-341
    • T. Hirai, in Materials science and technology, Wiley-VCH, Weinheim, 3rd edn, 1996, vol. 17B, pp. 293-341
    • (1996) Materials Science and Technology , vol.17
    • Hirai, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.