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Volumn 84, Issue 10, 2013, Pages

Femtosecond photoelectron point projection microscope

Author keywords

[No Author keywords available]

Indexed keywords

AUTOCORRELATION TECHNIQUES; CONVENTIONAL DESIGN; EMISSION PROCESS; NEAR FIELD EFFECT; PHOTOEMITTED ELECTRONS; POINT PROJECTION; SPATIAL RESOLUTION; TEMPORAL RESOLUTION;

EID: 84887322558     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4827035     Document Type: Article
Times cited : (65)

References (26)
  • 1
    • 77950802384 scopus 로고    scopus 로고
    • Four-dimensional electron microscopy
    • 10.1126/science.1166135
    • A. H. Zewail, " Four-dimensional electron microscopy.," Science 328 (5975), 187-193 (2010). 10.1126/science.1166135
    • (2010) Science , vol.328 , Issue.5975 , pp. 187-193
    • Zewail, A.H.1
  • 2
    • 84885601650 scopus 로고    scopus 로고
    • Design and implementation of a fs-resolved transmission electron microscope based on thermionic gun technology
    • 10.1016/j.chemphys.2013.06.026
    • L. Piazza, D. J. Masiel, T. LaGrange, B. W. Reed, B. Barwick, and F. Carbone, " Design and implementation of a fs-resolved transmission electron microscope based on thermionic gun technology.," Chem. Phys. 423, 79-84 (2013). 10.1016/j.chemphys.2013.06.026
    • (2013) Chem. Phys. , vol.423 , pp. 79-84
    • Piazza, L.1    Masiel, D.J.2    Lagrange, T.3    Reed, B.W.4    Barwick, B.5    Carbone, F.6
  • 3
    • 71049176674 scopus 로고    scopus 로고
    • Ultrafast imaging of photoelectron packets generated from graphite surface
    • 10.1063/1.3259779
    • R. K. Raman, Z. Tao, T.-R. Han, and C.-Y. Ruan, " Ultrafast imaging of photoelectron packets generated from graphite surface.," Appl. Phys. Lett. 95 (18), 181108 (2009). 10.1063/1.3259779
    • (2009) Appl. Phys. Lett. , vol.95 , Issue.18 , pp. 181108
    • Raman, R.K.1    Tao, Z.2    Han, T.-R.3    Ruan, C.-Y.4
  • 4
    • 43149084334 scopus 로고    scopus 로고
    • Picosecond electron deflectometry of optical-field ionized plasmas
    • 10.1038/nphoton.2008.77
    • M. Centurion, P. Reckenthaeler, S. A. Trushin, F. Krausz, and E. E. Fill, " Picosecond electron deflectometry of optical-field ionized plasmas.," Nat. Photon. 2 (5), 315-318 (2008). 10.1038/nphoton.2008.77
    • (2008) Nat. Photon. , vol.2 , Issue.5 , pp. 315-318
    • Centurion, M.1    Reckenthaeler, P.2    Trushin, S.A.3    Krausz, F.4    Fill, E.E.5
  • 5
    • 77952390972 scopus 로고    scopus 로고
    • Ultrafast electron beam imaging of femtosecond laser-induced plasma dynamics
    • 10.1063/1.3380846
    • J. Li, X. Wang, Z. Chen, R. Clinite, S. S. Mao, P. Zhu, Z. Sheng, J. Zhang, and J. Cao, " Ultrafast electron beam imaging of femtosecond laser-induced plasma dynamics.," J. Appl. Phys. 107 (8), 083305 (2010). 10.1063/1.3380846
    • (2010) J. Appl. Phys. , vol.107 , Issue.8 , pp. 083305
    • Li, J.1    Wang, X.2    Chen, Z.3    Clinite, R.4    Mao, S.S.5    Zhu, P.6    Sheng, Z.7    Zhang, J.8    Cao, J.9
  • 6
    • 84872742278 scopus 로고    scopus 로고
    • Single-shot 35 fs temporal resolution electron shadowgraphy
    • 10.1063/1.4776686
    • C. M. Scoby, R. K. Li, E. Threlkeld, H. To, and P. Musumeci, " Single-shot 35 fs temporal resolution electron shadowgraphy.," Appl. Phys. Lett. 102 (2), 023506 (2013). 10.1063/1.4776686
    • (2013) Appl. Phys. Lett. , vol.102 , Issue.2 , pp. 023506
    • Scoby, C.M.1    Li, R.K.2    Threlkeld, E.3    To, H.4    Musumeci, P.5
  • 8
    • 79951988200 scopus 로고    scopus 로고
    • Laser photoelectron projection microscopy of an organic conducting polymer
    • 10.1134/S0021364010230128
    • B. N. Mironov, S. A. Aseev, S. V. Chekalin, V. F. Ivanov, and O. L. Gribkova, " Laser photoelectron projection microscopy of an organic conducting polymer.," JETP Lett. 92 (11), 779-782 (2010). 10.1134/S0021364010230128
    • (2010) JETP Lett. , vol.92 , Issue.11 , pp. 779-782
    • Mironov, B.N.1    Aseev, S.A.2    Chekalin, S.V.3    Ivanov, V.F.4    Gribkova, O.L.5
  • 10
    • 33344457612 scopus 로고    scopus 로고
    • Field emission tip as a nanometer source of free electron femtosecond pulses
    • 10.1103/PhysRevLett.96.077401
    • P. Hommelhoff, Y. Sortais, A. Aghajani-Talesh, and M. Kasevich, " Field emission tip as a nanometer source of free electron femtosecond pulses.," Phys. Rev. Lett. 96, 077401 (2006). 10.1103/PhysRevLett.96.077401
    • (2006) Phys. Rev. Lett. , vol.96 , pp. 077401
    • Hommelhoff, P.1    Sortais, Y.2    Aghajani-Talesh, A.3    Kasevich, M.4
  • 11
    • 33845525831 scopus 로고    scopus 로고
    • Ultrafast electron pulses from a tungsten tip triggered by low-power femtosecond laser pulses
    • 10.1103/PhysRevLett.97.247402
    • P. Hommelhoff, C. Kealhofer, and M. A. Kasevich, " Ultrafast electron pulses from a tungsten tip triggered by low-power femtosecond laser pulses.," Phys. Rev. Lett. 97, 247402 (2006). 10.1103/PhysRevLett.97.247402
    • (2006) Phys. Rev. Lett. , vol.97 , pp. 247402
    • Hommelhoff, P.1    Kealhofer, C.2    Kasevich, M.A.3
  • 12
    • 33846496035 scopus 로고    scopus 로고
    • Localized multiphoton emission of femtosecond electron pulses from metal nanotips
    • 10.1103/PhysRevLett.98.043907
    • C. Ropers, D. R. Solli, C. P. Schulz, C. Lienau, and T. Elsaesser, " Localized multiphoton emission of femtosecond electron pulses from metal nanotips.," Phys. Rev. Lett. 98, 043907 (2007). 10.1103/PhysRevLett.98. 043907
    • (2007) Phys. Rev. Lett. , vol.98 , pp. 043907
    • Ropers, C.1    Solli, D.R.2    Schulz, C.P.3    Lienau, C.4    Elsaesser, T.5
  • 13
    • 79960055097 scopus 로고    scopus 로고
    • Attosecond control of electrons emitted from a nanoscale metal tip
    • 10.1038/nature10196
    • M. Krüger, M. Schenk, and P. Hommelhoff, " Attosecond control of electrons emitted from a nanoscale metal tip.," Nature (London) 475 (7354), 78-81 (2011). 10.1038/nature10196
    • (2011) Nature (London) , vol.475 , Issue.7354 , pp. 78-81
    • Krüger, M.1    Schenk, M.2    Hommelhoff, P.3
  • 15
    • 0345434374 scopus 로고
    • Low-energy-electron diffraction by nano-objects in projection microscopy without magnetic shielding
    • 10.1063/1.112648
    • V. T. Binh, V. Semet, and N. Garcia, " Low-energy-electron diffraction by nano-objects in projection microscopy without magnetic shielding.," Appl. Phys. Lett. 65 (19), 2493-2495 (1994). 10.1063/1.112648
    • (1994) Appl. Phys. Lett. , vol.65 , Issue.19 , pp. 2493-2495
    • Binh, V.T.1    Semet, V.2    Garcia, N.3
  • 16
    • 35548942235 scopus 로고    scopus 로고
    • A high repetition rate time-of-flight electron energy analyzer
    • 10.1063/1.2801523
    • S. A. Hilbert, B. Barwick, M. Fabrikant, C. Uiterwaal, and H. Batelaan, " A high repetition rate time-of-flight electron energy analyzer.," Appl. Phys. Lett. 91 (17), 173506 (2007). 10.1063/1.2801523
    • (2007) Appl. Phys. Lett. , vol.91 , Issue.17 , pp. 173506
    • Hilbert, S.A.1    Barwick, B.2    Fabrikant, M.3    Uiterwaal, C.4    Batelaan, H.5
  • 18
    • 0008600417 scopus 로고    scopus 로고
    • Low-energy electron point source microscope with position-sensitive electron energy analyzer
    • 10.1063/1.1150070
    • J.-Y. Park, S. H. Kim, Y. D. Suh, W. G. Park, and Y. Kuk, " Low-energy electron point source microscope with position-sensitive electron energy analyzer.," Rev. Sci. Instrum. 70 (11), 4304-4307 (1999). 10.1063/1.1150070
    • (1999) Rev. Sci. Instrum. , vol.70 , Issue.11 , pp. 4304-4307
    • Park, J.-Y.1    Kim, S.H.2    Suh, Y.D.3    Park, W.G.4    Kuk, Y.5
  • 19
    • 78650545124 scopus 로고    scopus 로고
    • Single-electron pulses for ultrafast diffraction
    • 10.1073/pnas.1010165107
    • M. Aidelsburger, F. O. Kirchner, F. Krausz, and P. Baum, " Single-electron pulses for ultrafast diffraction.," Proc. Natl. Acad. Sci. U.S.A. 107 (46), 19714-19719 (2010). 10.1073/pnas.1010165107
    • (2010) Proc. Natl. Acad. Sci. U.S.A. , vol.107 , Issue.46 , pp. 19714-19719
    • Aidelsburger, M.1    Kirchner, F.O.2    Krausz, F.3    Baum, P.4
  • 20
    • 43749109902 scopus 로고    scopus 로고
    • Ultrashort electron pulses for diffraction, crystallography and microscopy: Theoretical and experimental resolutions
    • 10.1039/b802136h
    • A. Gahlmann, S. T. Park, and A. H. Zewail, " Ultrashort electron pulses for diffraction, crystallography and microscopy: Theoretical and experimental resolutions.," Phys. Chem. Chem. Phys. 10, 2894-2909 (2008). 10.1039/b802136h
    • (2008) Phys. Chem. Chem. Phys. , vol.10 , pp. 2894-2909
    • Gahlmann, A.1    Park, S.T.2    Zewail, A.H.3
  • 21
    • 72449204105 scopus 로고    scopus 로고
    • Photon induced near-field electron microscopy
    • 10.1038/nature08662
    • B. Barwick, D. Flannigan, and A. H. Zewail, " Photon induced near-field electron microscopy.," Nature (London) 462, 902-906 (2009). 10.1038/nature08662
    • (2009) Nature (London) , vol.462 , pp. 902-906
    • Barwick, B.1    Flannigan, D.2    Zewail, A.H.3
  • 22
    • 33344457050 scopus 로고    scopus 로고
    • Diffraction of 0.5 keV electrons from free-standing transmission gratings
    • 10.1016/j.ultramic.2005.11.003
    • B. McMorran, J. D. Perreault, T. Savas, and A. Cronin, " Diffraction of 0.5 keV electrons from free-standing transmission gratings.," Ultramicroscopy 106, 356-364 (2006). 10.1016/j.ultramic.2005.11.003
    • (2006) Ultramicroscopy , vol.106 , pp. 356-364
    • McMorran, B.1    Perreault, J.D.2    Savas, T.3    Cronin, A.4
  • 24
    • 40949135068 scopus 로고    scopus 로고
    • A time-of-flight spectrometer for angle-resolved detection of low energy electrons in two dimensions
    • 10.1007/s00339-008-4422-5
    • P. S. Kirchmann, L. Rettig, D. Nandi, U. Lipowski, M. Wolf, and U. Bovensiepen, " A time-of-flight spectrometer for angle-resolved detection of low energy electrons in two dimensions.," Appl. Phys. A 91 (2), 211-217 (2008). 10.1007/s00339-008-4422-5
    • (2008) Appl. Phys. A , vol.91 , Issue.2 , pp. 211-217
    • Kirchmann, P.S.1    Rettig, L.2    Nandi, D.3    Lipowski, U.4    Wolf, M.5    Bovensiepen, U.6
  • 25
    • 84855204981 scopus 로고    scopus 로고
    • Enhancing image contrast and slicing electron pulses in 4D near field electron microscopy
    • 10.1016/j.cplett.2011.11.031
    • S. T. Park and A. H. Zewail, " Enhancing image contrast and slicing electron pulses in 4D near field electron microscopy.," Chem. Phys. Lett. 521, 1-6 (2012). 10.1016/j.cplett.2011.11.031
    • (2012) Chem. Phys. Lett. , vol.521 , pp. 1-6
    • Park, S.T.1    Zewail, A.H.2


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