Low-energy electron point source microscope with position-sensitive electron energy analyzer

Review of Scientific Instruments

Volumn 70, Issue 11, 1999, Pages 4304-4307

  Park, Jeong Young ^a,b   Kim, S H ^a   Suh, Y D ^a   Park, W G ^a   Kuk, Y ^a  

^a Seoul National University   (South Korea)

^b Bldg 142   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008600417     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150070     Document Type: Article

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