-
3
-
-
37349069493
-
-
Van Durme J., Dewulf J., Leys C., Van Langenhove H. Appl. Catal. B: Environ. 2008, 78(3-4):324.
-
(2008)
Appl. Catal. B: Environ.
, vol.78
, Issue.3-4
, pp. 324
-
-
Van Durme, J.1
Dewulf, J.2
Leys, C.3
Van Langenhove, H.4
-
4
-
-
64349099579
-
-
Chen H.L., Lee H.M., Chen S.H., Chang M.B., Yu S.J., Li S.N. Environ. Sci. Technol. 2009, 43:2216.
-
(2009)
Environ. Sci. Technol.
, vol.43
, pp. 2216
-
-
Chen, H.L.1
Lee, H.M.2
Chen, S.H.3
Chang, M.B.4
Yu, S.J.5
Li, S.N.6
-
5
-
-
80054108406
-
-
Vandenbroucke A.M., Morent R., De Geyter N., Leys C. J. Hazard. Mater. 2011, 195:30-54.
-
(2011)
J. Hazard. Mater.
, vol.195
, pp. 30-54
-
-
Vandenbroucke, A.M.1
Morent, R.2
De Geyter, N.3
Leys, C.4
-
6
-
-
79751511961
-
-
Vandenbroucke A.M., Morent R., De Geyter N., Leys C. J. Adv. Oxid. Technol. 2011, 14:165.
-
(2011)
J. Adv. Oxid. Technol.
, vol.14
, pp. 165
-
-
Vandenbroucke, A.M.1
Morent, R.2
De Geyter, N.3
Leys, C.4
-
7
-
-
84864533707
-
-
Vandenbroucke A.M., Morent R., De Geyter N., Leys C. J. Adv. Oxid. Technol. 2012, 15:232.
-
(2012)
J. Adv. Oxid. Technol.
, vol.15
, pp. 232
-
-
Vandenbroucke, A.M.1
Morent, R.2
De Geyter, N.3
Leys, C.4
-
12
-
-
31544471406
-
-
Morent R., Dewulf J., Steenhaut N., Leys C., Van Langenhove H. J. Adv. Oxid. Technol. 2006, 9(1):53.
-
(2006)
J. Adv. Oxid. Technol.
, vol.9
, Issue.1
, pp. 53
-
-
Morent, R.1
Dewulf, J.2
Steenhaut, N.3
Leys, C.4
Van Langenhove, H.5
-
13
-
-
34447260735
-
-
Magureanu M., Mandache N.B., Parvulescu V.I., Subrahmanyam C., Renken A., Kiwi-Minsker L. Appl. Catal. B: Environ. 2007, 74(3-4):270.
-
(2007)
Appl. Catal. B: Environ.
, vol.74
, Issue.3-4
, pp. 270
-
-
Magureanu, M.1
Mandache, N.B.2
Parvulescu, V.I.3
Subrahmanyam, C.4
Renken, A.5
Kiwi-Minsker, L.6
-
18
-
-
35448995563
-
-
Magureanu M., Mandache N.B., Hu J.C., Richards R., Florea M., Parvulescu V.I. Appl. Catal. B: Environ. 2007, 76(3-4):275.
-
(2007)
Appl. Catal. B: Environ.
, vol.76
, Issue.3-4
, pp. 275
-
-
Magureanu, M.1
Mandache, N.B.2
Hu, J.C.3
Richards, R.4
Florea, M.5
Parvulescu, V.I.6
-
19
-
-
80054124283
-
-
Vandenbroucke A.M., Morent R., De Geyter N., Nguyen Dinh M.T., Giraudon J.-M., Lamonier J.-F., Leys C. Int. J. Plasma Environ. Sci. Technol. 2010, 4(2-9):135.
-
(2010)
Int. J. Plasma Environ. Sci. Technol.
, vol.4
, Issue.2-9
, pp. 135
-
-
Vandenbroucke, A.M.1
Morent, R.2
De Geyter, N.3
Nguyen Dinh, M.T.4
Giraudon, J.-M.5
Lamonier, J.-F.6
Leys, C.7
-
20
-
-
0027684517
-
-
Akishev Y.S., Deryugin A.A., Kochetov I.V., Napartovich A.P., Trushkin N.I. J. Phys. D: Appl. Phys. 1993, 26:1630.
-
(1993)
J. Phys. D: Appl. Phys.
, vol.26
, pp. 1630
-
-
Akishev, Y.S.1
Deryugin, A.A.2
Kochetov, I.V.3
Napartovich, A.P.4
Trushkin, N.I.5
-
21
-
-
0034347216
-
-
Akishev Y.S., Grushin M., Kochetov I.V., Napartovich A.P., Pan'kin M., Trushkin N.I. Plasma Phys. Rep. 2000, 26:157.
-
(2000)
Plasma Phys. Rep.
, vol.26
, pp. 157
-
-
Akishev, Y.S.1
Grushin, M.2
Kochetov, I.V.3
Napartovich, A.P.4
Pan'kin, M.5
Trushkin, N.I.6
-
22
-
-
0035929084
-
-
Akishev Y.S., Goossens O., Callebaut T., Leys C., Napartovich A.P., Trushkin N.I. J. Phys. D: Appl. Phys. 2001, 34:2875.
-
(2001)
J. Phys. D: Appl. Phys.
, vol.34
, pp. 2875
-
-
Akishev, Y.S.1
Goossens, O.2
Callebaut, T.3
Leys, C.4
Napartovich, A.P.5
Trushkin, N.I.6
-
23
-
-
0042823685
-
-
Vertriest R., Morent R., Dewulf J., Leys C., Van Langenhove H. Plasma Sources Sci. Technol. 2003, 12(3):412.
-
(2003)
Plasma Sources Sci. Technol.
, vol.12
, Issue.3
, pp. 412
-
-
Vertriest, R.1
Morent, R.2
Dewulf, J.3
Leys, C.4
Van Langenhove, H.5
-
25
-
-
0033607825
-
-
Sinquin G., Hindermann J.P., Petit C., Kiennemann A. Catal. Today 1999, 54:107.
-
(1999)
Catal. Today
, vol.54
, pp. 107
-
-
Sinquin, G.1
Hindermann, J.P.2
Petit, C.3
Kiennemann, A.4
-
26
-
-
0035886489
-
-
Sinquin G., Petit C., Hindermann J.P., Kiennemann A. Catal. Today 2001, 70:183.
-
(2001)
Catal. Today
, vol.70
, pp. 183
-
-
Sinquin, G.1
Petit, C.2
Hindermann, J.P.3
Kiennemann, A.4
-
27
-
-
0035796417
-
-
Sinquin G., Petit C., Libs S., Hindermann J.P., Kiennemann A. Appl. Catal. B: Environ. 2001, 32:37.
-
(2001)
Appl. Catal. B: Environ.
, vol.32
, pp. 37
-
-
Sinquin, G.1
Petit, C.2
Libs, S.3
Hindermann, J.P.4
Kiennemann, A.5
-
30
-
-
0035901981
-
-
Radhakrishnan R., Oyama S.T., Chen J.G., Asakura K. J. Phys. Chem. B 2001, 105:4245.
-
(2001)
J. Phys. Chem. B
, vol.105
, pp. 4245
-
-
Radhakrishnan, R.1
Oyama, S.T.2
Chen, J.G.3
Asakura, K.4
-
31
-
-
80255135594
-
-
Vandenbroucke A.M., Nguyen Dinh M.T., Giraudon J.-M., Morent R., De Geyter N., Lamonier J.-F., Leys C. Plasma Chem. Plasma Process. 2011, 31:707.
-
(2011)
Plasma Chem. Plasma Process.
, vol.31
, pp. 707
-
-
Vandenbroucke, A.M.1
Nguyen Dinh, M.T.2
Giraudon, J.-M.3
Morent, R.4
De Geyter, N.5
Lamonier, J.-F.6
Leys, C.7
-
34
-
-
28244453353
-
-
Joung S.-K., Amemiya T., Murabayashi M., Cai R., Itoh K. Surface Science 2005, 598:174-184.
-
(2005)
Surface Science
, vol.598
, pp. 174-184
-
-
Joung, S.-K.1
Amemiya, T.2
Murabayashi, M.3
Cai, R.4
Itoh, K.5
-
35
-
-
0000894884
-
-
Miyake A., Nakagawa I., Miyazawa T., Ichishima I., Shimanouchi T., Mizushima S. Spectrochimica Acta 1958, 13:161.
-
(1958)
Spectrochimica Acta
, vol.13
, pp. 161
-
-
Miyake, A.1
Nakagawa, I.2
Miyazawa, T.3
Ichishima, I.4
Shimanouchi, T.5
Mizushima, S.6
-
38
-
-
2442713952
-
-
Borisch J., Pilkenton S., Miller M.L., Raftery D., Francisco J.S. J. Phys. Chem. B 2004, 108:5640-5646.
-
(2004)
J. Phys. Chem. B
, vol.108
, pp. 5640-5646
-
-
Borisch, J.1
Pilkenton, S.2
Miller, M.L.3
Raftery, D.4
Francisco, J.S.5
-
39
-
-
84887137625
-
-
Niki H., Maker P.D., Breitenbach L.P., Savage C.M. Chem. Phys. Lett. 1978, 57:4.
-
(1978)
Chem. Phys. Lett.
, vol.57
, pp. 4
-
-
Niki, H.1
Maker, P.D.2
Breitenbach, L.P.3
Savage, C.M.4
-
41
-
-
0000993560
-
-
Kiessling D., Schneider R., Kraak P., Haftendorn M., Wendt G. Appl. Catal. B 1998, 19:143.
-
(1998)
Appl. Catal. B
, vol.19
, pp. 143
-
-
Kiessling, D.1
Schneider, R.2
Kraak, P.3
Haftendorn, M.4
Wendt, G.5
-
42
-
-
2142780806
-
-
PerkinElmer Corporation, Eden Prairie, G.E. Muilenberg (Ed.)
-
Wagner C.D., Riggs W.M., Davis L.E., Mulder J.F. Handbook of X-ray Photoelectron Spectroscopy 1978, PerkinElmer Corporation, Eden Prairie. G.E. Muilenberg (Ed.).
-
(1978)
Handbook of X-ray Photoelectron Spectroscopy
-
-
Wagner, C.D.1
Riggs, W.M.2
Davis, L.E.3
Mulder, J.F.4
|