Discovering signature patterns from event logs

Proceedings of the 2013 IEEE Symposium on Computational Intelligence and Data Mining, CIDM 2013 - 2013 IEEE Symposium Series on Computational Intelligence, SSCI 2013

Volumn , Issue , 2013, Pages 111-118

  Bose, R P Jagadeesh Chandra ^a   Van Der Aalst, Wil M P ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Discriminatory Patterns; Event Log; Process Mining; Signature Patterns

Indexed keywords

DISCRIMINATORY PATTERNS; EVENT LOG; FEATURE EXTRACTION AND SELECTION; ORGANIZATIONAL PROCESS; PROCESS IMPROVEMENT; PROCESS MINING; SIGNATURE DISCOVERY; SIGNATURE PATTERNS;

DATA MINING; FEATURE EXTRACTION;

ARTIFICIAL INTELLIGENCE;

EID: 84885632286     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CIDM.2013.6597225     Document Type: Conference Paper

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