Variation of the vibration profile of piezoelectric resonant sensors with different electrode conductivity at high temperatures

Sensors and Actuators, B: Chemical

Volumn 187, Issue , 2013, Pages 247-253

  Schmidtchen, Silja ^a   Richter, Denny ^a   Fritze, Holger ^a  

^a CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

High temperature; Langasite; Laser Doppler interferometer; Piezoelectricity

Indexed keywords

CHEMICAL STABILITY; CLASSIFIERS; CRYSTALLOGRAPHY; DOPPLER EFFECT; ELECTRODES; HIGH TEMPERATURE APPLICATIONS; INTERFEROMETERS; METALLIC COMPOUNDS; METALS; PIEZOELECTRICITY; RESONATORS; VIBRATIONS (MECHANICAL);

DISPLACEMENT CHARACTERISTIC; ELECTRICAL AND MECHANICAL PROPERTIES; HIGH TEMPERATURE; LANGASITES; LASER DOPPLER INTERFEROMETERS; OXYGEN PARTIAL PRESSURE; PIEZOELECTRIC RESONATORS; THICKNESS-SHEAR MODE RESONATOR;

OXIDE FILMS;

EID: 84885479049     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2012.11.015     Document Type: Article

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