Estimation of thermal conductivity of amorphous silicon thin films from the optical reflectivity measurement

Journal of Nanoscience and Nanotechnology

Volumn 13, Issue 9, 2013, Pages 6362-6366

  Moon, Seung Jae ^a   Choi, Jung Hyun ^b  

^a Hanyang University   (South Korea)

^b Ewha Womans University   (South Korea)

Author keywords

Amorphous silicon; Heat conduction; Optical properties; Reflectivity; Thermal conductivity

Indexed keywords

AMORPHOUS SILICON (A-SI); AMORPHOUS SILICON THIN FILMS; EXTINCTION COEFFICIENTS; PHASE TRANSFORMATION MECHANISMS; POLYSILICON THIN FILMS; RECRYSTALLIZATION PROCESS; SOLAR-CELL APPLICATIONS; TRANSIENT REFLECTIVITY;

AMORPHOUS SILICON; EXCIMER LASERS; HEAT CONDUCTION; LIQUID CRYSTAL DISPLAYS; OPTICAL PROPERTIES; REFLECTION; REFRACTIVE INDEX; SILICON; THIN FILMS;

THERMAL CONDUCTIVITY;

EID: 84885437551     PISSN: 15334880     EISSN: 15334899     Source Type: Journal    
DOI: 10.1166/jnn.2013.7712     Document Type: Article

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