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Journal of the Korean Physical Society

Volumn 45, Issue 6, 2004, Pages 1644-1654

Effectiveness of optical diagnostics in unraveling the silicon-thin-film crystallization mechanism

(1) Moon, Seungjae a

a Hanyang University (South Korea)

Author keywords

Amorphous silicon; Emission, supercooling; Laser annealing; Optical diagnostics; Poly silicon; Silicon thin film; Thin film transistor

Indexed keywords

EID: 17544374445 PISSN: 03744884 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (4)

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