Wafer-scale metasurface for total power absorption, local field enhancement and single molecule Raman spectroscopy

Scientific Reports

Volumn 3, Issue , 2013, Pages

  Wang, Dongxing ^a   Zhu, Wenqi ^a   Best, Michael D ^b   Camden, Jon P ^b   Crozier, Kenneth B ^a  

^a HARVARD UNIVERSITY   (United States)

^b UNIVERSITY OF TENNESSEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

METAL; METAL NANOPARTICLE; NANOMATERIAL; SILICON; SILVER;

ABSORPTION; ARTICLE; CHEMISTRY; RAMAN SPECTROMETRY; SURFACE PROPERTY; ULTRASTRUCTURE;

ABSORPTION; METAL NANOPARTICLES; METALS; NANOSTRUCTURES; SILICON; SILVER; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES;

EID: 84885391628     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep02867     Document Type: Article

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