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Volumn 70, Issue 11, 2013, Pages 917-933

A comprehensive approach to optimal software rejuvenation

Author keywords

Accelerated life tests; Importance sampling; Memory leaks; Non parametric estimation; Optimal software rejuvenation; Semi Markov process

Indexed keywords

ACCELERATED LIFE TESTS; MEMORY LEAKS; NON-PARAMETRIC ESTIMATIONS; SEMI MARKOV PROCESS; SOFTWARE REJUVENATION;

EID: 84885152176     PISSN: 01665316     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.peva.2013.05.010     Document Type: Article
Times cited : (36)

References (33)
  • 3
    • 0028994247 scopus 로고
    • Software rejuvenation: Analysis, module and applications
    • IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA
    • Y. Huang, C. Kinatla, and N. Kolertis Software rejuvenation: analysis, module and applications 25th Symposium on Fault Tolerant Computing 1995 IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA 381 390
    • (1995) 25th Symposium on Fault Tolerant Computing , pp. 381-390
    • Huang, Y.1    Kinatla, C.2    Kolertis, N.3
  • 6
    • 63149182279 scopus 로고    scopus 로고
    • A nonlinear approach to modeling of software aging in a web server
    • IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA
    • Y.F. Jia, L. Zhao, and K.-Y. Cai A nonlinear approach to modeling of software aging in a web server 15th Asia-Pacific Software Engineering Conference 2008 IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA 77 84
    • (2008) 15th Asia-Pacific Software Engineering Conference , pp. 77-84
    • Jia, Y.F.1    Zhao, L.2    Cai, K.-Y.3
  • 7
    • 34247278391 scopus 로고
    • Fatal error: How patriot overlooked a scud
    • E. Marshall Fatal error: how patriot overlooked a scud Science 255 5050 1992 1347
    • (1992) Science , vol.255 , Issue.5050 , pp. 1347
    • Marshall, E.1
  • 8
    • 0036926455 scopus 로고    scopus 로고
    • Advanced pattern recognition for detection of complex software aging in online transaction processing servers
    • IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA
    • K.J. Cassidy, K.C. Gross, and A. Malekpour Advanced pattern recognition for detection of complex software aging in online transaction processing servers 2010 International Conference on Dependable Systems and Networks 2010 IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA 478 482
    • (2010) 2010 International Conference on Dependable Systems and Networks , pp. 478-482
    • Cassidy, K.J.1    Gross, K.C.2    Malekpour, A.3
  • 9
    • 0037107240 scopus 로고    scopus 로고
    • Predicting operational software availability and its applications to telecommunication systems
    • X. Zhang, and H. Pham Predicting operational software availability and its applications to telecommunication systems International Journal of Systems Science 33 11 2002 923 930
    • (2002) International Journal of Systems Science , vol.33 , Issue.11 , pp. 923-930
    • Zhang, X.1    Pham, H.2
  • 11
    • 79952025615 scopus 로고    scopus 로고
    • Using accelerated life tests to estimate time to software aging failure
    • IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA
    • R. Matias, K.S. Trivedi, and P.R. Maciel Using accelerated life tests to estimate time to software aging failure ISSRE 2010 2010 IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA 211 219
    • (2010) ISSRE 2010 , pp. 211-219
    • Matias, R.1    Trivedi, K.S.2    Maciel, P.R.3
  • 13
    • 0031702473 scopus 로고    scopus 로고
    • Analysis of preventive maintenance in transactions based software systems
    • S. Garg, A. Puliafito, M. Telek, and K.S. Trivedi Analysis of preventive maintenance in transactions based software systems IEEE Transactions on Computers 47 1 1998 96 107 (Pubitemid 128740944)
    • (1998) IEEE Transactions on Computers , vol.47 , Issue.1 , pp. 96-107
    • Garg, S.1    Puliafito, A.2    Telek, M.3    Trivedi, K.4
  • 14
    • 27844593365 scopus 로고    scopus 로고
    • A workload-based analysis of software aging, and rejuvenation
    • DOI 10.1109/TR.2005.853442
    • Y.J. Bao, X. Sun, and K.S. Trivedi A workload-based analysis of software aging and rejuvenation IEEE Transactions on Reliability 54 3 2005 541 548 (Pubitemid 41638271)
    • (2005) IEEE Transactions on Reliability , vol.54 , Issue.3 , pp. 541-548
    • Bao, Y.1    Sun, X.2    Trivedi, K.S.3
  • 15
    • 47249109380 scopus 로고    scopus 로고
    • High-available grid services through the use of virtualized clustering
    • IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA
    • J. Alonso, L. Silva, A. Andrzejak, P. Silva, and J. Torres High-available grid services through the use of virtualized clustering 2007 Intl. Conf. on Grid Computing 2007 IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA 34 41
    • (2007) 2007 Intl. Conf. on Grid Computing , pp. 34-41
    • Alonso, J.1    Silva, L.2    Andrzejak, A.3    Silva, P.4    Torres, J.5
  • 18
    • 77949270254 scopus 로고    scopus 로고
    • Accelerated degradation tests applied to software aging experiments
    • R. Matias, P.A. Barbetta, and K.S. Trivedi Accelerated degradation tests applied to software aging experiments IEEE Transactions on Reliability 59 1 2010 102 114
    • (2010) IEEE Transactions on Reliability , vol.59 , Issue.1 , pp. 102-114
    • Matias, R.1    Barbetta, P.A.2    Trivedi, K.S.3
  • 20
    • 84863167425 scopus 로고    scopus 로고
    • Injecting memory leak to accelerate software failures
    • IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA
    • J. Zhao, Y.L. Jin, K.S. Trivedi, and R. Matias Injecting memory leak to accelerate software failures ISSRE 2011 2011 IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA 260 269
    • (2011) ISSRE 2011 , pp. 260-269
    • Zhao, J.1    Jin, Y.L.2    Trivedi, K.S.3    Matias, R.4
  • 22
    • 84949519090 scopus 로고    scopus 로고
    • Statistical non-parametric algorithms to estimate the optimal software rejuvenation schedule
    • IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA
    • T. Dohi, K. Goseva-Popstojanova, and K.S. Trivedi Statistical non-parametric algorithms to estimate the optimal software rejuvenation schedule 2000 Pacific Rim Int'l Symp. Dependable Computing PRDC 2000 IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA 77 84
    • (2000) 2000 Pacific Rim Int'l Symp. Dependable Computing PRDC , pp. 77-84
    • Dohi, T.1    Goseva-Popstojanova, K.2    Trivedi, K.S.3
  • 25
    • 77956590859 scopus 로고    scopus 로고
    • Adaptive on-line software aging prediction based on machine learning
    • IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA
    • J. Alonso, J. Berral, R. Gavald, and J. Torres Adaptive on-line software aging prediction based on machine learning 2010 Intl. Conf. Dependable Systems and Networks DSN 2010 2010 IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA 507 516
    • (2010) 2010 Intl. Conf. Dependable Systems and Networks DSN 2010 , pp. 507-516
    • Alonso, J.1    Berral, J.2    Gavald, R.3    Torres, J.4
  • 26
    • 84949201980 scopus 로고    scopus 로고
    • Analysis of periodic preventive maintenance with general system failure distribution
    • IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA
    • D.Y. Chen, and K.S. Trivedi Analysis of periodic preventive maintenance with general system failure distribution 2001 Pacific Rim International Symposium on Dependable Computing 2001 IEEE 2001 L Street, NW. Suite 700 Washington, DC 20036-4910, USA 103 107
    • (2001) 2001 Pacific Rim International Symposium on Dependable Computing , pp. 103-107
    • Chen, D.Y.1    Trivedi, K.S.2
  • 29
    • 84947348224 scopus 로고
    • Estimates of the regression coefficient based on kendall's tau
    • P. Sen Estimates of the regression coefficient based on kendall's tau Journal of the American Statistical Association 63 4 1968 1379 1389
    • (1968) Journal of the American Statistical Association , vol.63 , Issue.4 , pp. 1379-1389
    • Sen, P.1
  • 32
    • 0002005187 scopus 로고
    • Total time on test processes and applications to failure data analysis
    • R.E. Barlow, J. Fussell, N.D. Singpurwalla, SIAM Philadelphia
    • R.E. Barlow, and R. Campo Total time on test processes and applications to failure data analysis R.E. Barlow, J. Fussell, N.D. Singpurwalla, Reliability and Fault Tree Analysis 1975 SIAM Philadelphia 451 481
    • (1975) Reliability and Fault Tree Analysis , pp. 451-481
    • Barlow, R.E.1    Campo, R.2


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