Injecting memory leaks to accelerate software failures

Proceedings - International Symposium on Software Reliability Engineering, ISSRE

Volumn , Issue , 2011, Pages 260-269

  Zhao, Jing ^a   Jin, Yuliang ^a   Trivedi, Kishor S ^b   Matias Jr , Rivalino ^c  

^a HARBIN ENGINEERING UNIVERSITY   (China)

^b USA   (United States)

^c FEDERAL UNIVERSITY OF UBERLÂNDIA   (Brazil)

Author keywords

accelerated life tests; memory leaks; optimal software rejuvenation; semi Markov process; software aging

Indexed keywords

ACCELERATED LIFE TESTS; MEMORY LEAKS; OPTIMAL SOFTWARE REJUVENATION; SEMI MARKOV PROCESS; SOFTWARE AGING;

BENCHMARKING; CODES (SYMBOLS); ENDOCRINOLOGY; EXPERIMENTS; MARKOV PROCESSES; NORMAL DISTRIBUTION; OPTIMIZATION; SOFTWARE RELIABILITY; TESTING; WEIBULL DISTRIBUTION;

SAFETY ENGINEERING;

EID: 84863167425     PISSN: 10719458     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSRE.2011.24     Document Type: Conference Paper

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