A comprehensive model for software rejuvenation

IEEE Transactions on Dependable and Secure Computing

Volumn 2, Issue 2, 2005, Pages 124-137

  Vaidyanathan, Kalyanaraman ^a   Trivedi, Kishor S ^b  

^a SUN MICROSYSTEMS   (United States)

^b Duke University   (United States)

Author keywords

Availability; Measurement based dependability evaluation; Semi Markov reward models; Software aging; Software rejuvenation; Workload characterization

Indexed keywords

AVAILABILITY; CLASSIFICATION (OF INFORMATION); MARKOV PROCESSES; MATHEMATICAL MODELS; UNIX;

MEASUREMENT-BASED DEPENDABILITY EVALUATION; SEMI-MARKOV REWARD MODELS; SOFTWARE AGING; SOFTWARE REJUVENATION; WORKLOAD CHARACTERIZATION;

COMPUTER SOFTWARE;

EID: 24344433562     PISSN: 15455971     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDSC.2005.15     Document Type: Conference Paper

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