Benefit of inserting a (Cu/Pt) intermixing dual barrier for the blocking temperature distribution of exchange biased Co/(Cu/Pt)/IrMn stacks

Applied Physics Letters

Volumn 103, Issue 4, 2013, Pages

  Akmaldinov, K ^a,b   Auffret, S ^a   Joumard, I ^a   Dieny, B ^a   Baltz, V ^a  

^a CEA GRENOBLE   (France)

^b CROCUS Technology   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETICS; BLOCKING TEMPERATURE DISTRIBUTION; DEVICE PERFORMANCE; EXCHANGE BIAS; INTERFACIAL QUALITIES; SPINTRONICS DEVICE;

MANGANESE; PLATINUM; SPIN GLASS; TEMPERATURE DISTRIBUTION;

MIXING;

EID: 84884991144     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4816816     Document Type: Article

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