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Volumn 545, Issue , 2013, Pages 130-139

Strain dependent microstructural modifications of BiCrO3 epitaxial thin films

(7) Kannan, Vijayanandhini a,b Arredondo, Miryam a Johann, Florian a Hesse, Dietrich a Labrugere, Christine b Maglione, Mario b Vrejoiu, Ionela a

a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

b UNIVERSITÉ DE BORDEAUX (France)

Author keywords

Dislocation; Epitaxy; Microscopy; Polytype; Strain

Indexed keywords

EPITAXIAL THIN FILMS; IN-PLANE COMPRESSIVE STRAIN; MICROSTRUCTURAL MODIFICATION; POLYTYPES; SATELLITE REFLECTIONS; SINGLE CRYSTALLINE SUBSTRATES; STOICHIOMETRIC RATIO; STRUCTURAL MODULATIONS;

BISMUTH; CHEMICAL ANALYSIS; CHEMICAL MODIFICATION; DISLOCATIONS (CRYSTALS); EPITAXIAL FILMS; FILM THICKNESS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); MICROSCOPIC EXAMINATION; PHOTOELECTRONS; STRAIN; SUBSTRATES; SURFACE DEFECTS; TENSILE STRAIN; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EPITAXIAL GROWTH;

EID: 84884977424 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2013.07.053 Document Type: Article

Times cited : (18)

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