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Volumn , Issue , 2010, Pages 147-150
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LCLS X-RAY pulse duration measurement using the statistical fluctuation method
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Author keywords
[No Author keywords available]
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Indexed keywords
AVERAGE NUMBERS;
EXPONENTIAL GROWTH;
GAMMA-DISTRIBUTION;
PULSE ENERGIES;
RADIATION PULSE;
SELF-AMPLIFIED SPONTANEOUS EMISSION;
STATISTICAL FLUCTUATIONS;
TEMPORAL DURATIONS;
FREE ELECTRON LASERS;
PROBABILITY DISTRIBUTIONS;
STATISTICAL MECHANICS;
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EID: 84884602761
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (11)
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