Statistical properties of radiation from VUV and X-ray free electron laser

Optics Communications

Volumn 148, Issue 4-6, 1998, Pages 383-403

  Saldin, E L ^a   Schneidmiller, E A ^a   Yurkov, M V ^b  

^a Automatic Systems Corporation   (Russian Federation)

^b JOINT INSTITUTE FOR NUCLEAR RESEARCH   (Russian Federation)

Author keywords

Coherence; Free electron laser; SASE; X ray laser

Indexed keywords

APPROXIMATION THEORY; COHERENT LIGHT; COMPUTER SIMULATION; COMPUTERS; CORRELATION METHODS; FREE ELECTRON LASERS; LIGHT POLARIZATION; MONOCHROMATORS; NONLINEAR OPTICS; ULTRAVIOLET RADIATION; X RAY LASERS;

SELF AMPLIFIED SPONTANEOUS EMISSION (SASE);

STATISTICAL OPTICS;

EID: 0032028192     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(97)00670-6     Document Type: Article

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