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Volumn 82, Issue 26, 1999, Pages 5261-5264
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Measurement of electron-beam bunch length and emittance using shot-noise-driven fluctuations in incoherent radiation
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRON EMISSION;
ELECTRON IRRADIATION;
ELECTRON SPECTROSCOPY;
MATHEMATICAL MODELS;
PHASE SPACE METHODS;
SHOT NOISE;
SPONTANEOUS EMISSION;
STATISTICAL METHODS;
ELECTRON BUNCHES;
ELECTRON BEAMS;
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EID: 0032607953
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.82.5261 Document Type: Article |
Times cited : (45)
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References (19)
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