Measurement of structural changes in tetragonal PZT ceramics under static and cyclic electric fields using a laboratory X-ray diffractometer

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 56, Issue 8, 2009, Pages 1546-1554

  Pramanick, Abhijit ^a   Jones, Jacob L ^a  

^a University of Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION PEAKS; DOMAIN SWITCHINGS; ELECTRIC-FIELD DIRECTIONS; ELECTRICAL LOADING; HYSTERSIS LOOP; IN-SITU; LATTICE PLANE; LATTICE STRAIN; LEAD ZIRCONATE TITANATE CERAMICS; MACROSCOPIC STRAINS; PIEZOELECTRIC PROPERTY; PZT CERAMICS; SQUARE-WAVE; STATIC ELECTRIC FIELDS; STRUCTURAL CHANGE; STRUCTURAL CHARACTERIZATION; TIME-RESOLVED X-RAY DIFFRACTION; X RAY DIFFRACTOMETERS;

DIFFRACTION; DIFFRACTOMETERS; ELECTRIC FIELD MEASUREMENT; ELECTRIC FIELDS; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC CERAMICS; PIEZOELECTRIC TRANSDUCERS; PIEZOELECTRICITY; SEMICONDUCTING LEAD COMPOUNDS; STRAIN; TITRATION; X RAY DIFFRACTION;

STRUCTURAL CERAMICS;

EID: 68649100243     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2009.1219     Document Type: Conference Paper

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