Indium oxide thin-film homo-junctions: Morphology and electrical properties

Journal of Applied Physics

Volumn 114, Issue 8, 2013, Pages

  Stankiewicz, Jolanta ^a   Villuendas, Francisco ^a   Pilar Lozano, María ^b   Díez, Isabel ^a  

^a UNIVERSITY OF ZARAGOZA   (Spain)

^b Instituto Tecnologico de La Construccion   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE VOLTAGE CHARACTERISTIC; DEPOSITION CONDITIONS; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL TRANSPORT; INTERFACE DEFECTS; POLYCRYSTALLINE THIN FILM; RECTIFYING BEHAVIORS; SPACE-CHARGE LAYERS;

ELECTRIC PROPERTIES; FILM GROWTH; GRAIN BOUNDARIES; MORPHOLOGY; OPTOELECTRONIC DEVICES; OXYGEN; PHOTOELECTRONS; X RAY PHOTOELECTRON SPECTROSCOPY;

INDIUM;

EID: 84883874777     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4819177     Document Type: Article

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