-
2
-
-
78449301381
-
-
(ed. S. Magdassi), World Scientific Pub., Singapore
-
V. Subramanian, The Chemistry of Inkjet Inks (ed. S. Magdassi), p. 283, World Scientific Pub., Singapore (2010).
-
(2010)
The Chemistry of Inkjet Inks
, pp. 283
-
-
Subramanian, V.1
-
7
-
-
79959681803
-
-
San Francisco, CA USA: IEEE Inst. Elec. Electron. Eng. Inc
-
G. Shaker, A. Rida, S. Safavi-Naeini, M. M. Tentzeris, and S. Nikolaou, Proc. 5th Euro. Conf. Antennas Propag. (EUCAP), p. 3001, IEEE Inst. Elec. Electron. Eng. Inc., San Francisco, CA USA (2011).
-
(2011)
Proc. 5th Euro. Conf. Antennas Propag. (EUCAP)
, pp. 3001
-
-
Shaker, G.1
Rida, A.2
Safavi-Naeini, S.3
Tentzeris, M.M.4
Nikolaou, S.5
-
8
-
-
77952313272
-
-
L. Yang, R. W. Zhang, D. Staiculescu, C. P. Wong, and M. M. Tentzeris, IEEE Antenn. Wirel. Pr. 8, 653 (2009).
-
(2009)
IEEE Antenn. Wirel. Pr.
, vol.8
, pp. 653
-
-
Yang, L.1
Zhang, R.W.2
Staiculescu, D.3
Wong, C.P.4
Tentzeris, M.M.5
-
9
-
-
70349980888
-
-
A. Rida, L. Yang, R. Vyas, and M. M. Tentzeris, IEEE Antennas Propag. M. 51, 13 (2009).
-
(2009)
IEEE Antennas Propag. M.
, vol.51
, pp. 13
-
-
Rida, A.1
Yang, L.2
Vyas, R.3
Tentzeris, M.M.4
-
10
-
-
73949097996
-
-
J. Perelaer, M. Klokkenburg, C. R. Hendriks, and U. S. Schubert, Adv. Mater. 21, 4830 (2009).
-
(2009)
Adv. Mater.
, vol.21
, pp. 4830
-
-
Perelaer, J.1
Klokkenburg, M.2
Hendriks, C.R.3
Schubert, U.S.4
-
11
-
-
36949029784
-
-
L. Yang, A. Rida, R. Vyas, and M. M. Tentzeris, IEEE T. Microw. Theory, 55, 2894 (2007).
-
(2007)
IEEE T. Microw. Theory
, vol.55
, pp. 2894
-
-
Yang, L.1
Rida, A.2
Vyas, R.3
Tentzeris, M.M.4
-
12
-
-
44349143228
-
-
T. Sekitani, Y. Noguchi, Y. Zschieschang, H. Klauk, and T. Someya, P. Natl. Acad. Sci. USA105, 4976 (2008).
-
(2008)
P. Natl. Acad. Sci. USA
, vol.105
, pp. 4976
-
-
Sekitani, T.1
Noguchi, Y.2
Zschieschang, Y.3
Klauk, H.4
Someya, T.5
-
14
-
-
23144448854
-
-
V. Subramanian, J. M. J. Frechet, P. C. Chang, D. C. Huang, J. B. Lee, S. E. Molesa, A. R. Murphy, D. R. Redinger, and S. K. Volkman, P. IEEE93, 1330 (2005).
-
(2005)
P. IEEE
, vol.93
, pp. 1330
-
-
Subramanian, V.1
Frechet, J.M.J.2
Chang, P.C.3
Huang, D.C.4
Lee, J.B.5
Molesa, S.E.6
Murphy, A.R.7
Redinger, D.R.8
Volkman, S.K.9
-
15
-
-
38849187155
-
-
T. H. J. van Osch, J. Perelaer, A. W. M. de Laat, and U. S. Schubert, Adv. Mater. 20, 343 (2008).
-
(2008)
Adv. Mater.
, vol.20
, pp. 343
-
-
van Osch, T.H.J.1
Perelaer, J.2
de Laat, A.W.M.3
Schubert, U.S.4
-
16
-
-
34547752436
-
-
S. H. Ko, H. Pan, C. P. Grigoropoulos, C. K. Luscombe, J. M. J. Frechet, and D. Poulikakos, Nanotechnology18, 345202 (2007).
-
(2007)
Nanotechnology
, vol.18
, pp. 345202
-
-
Ko, S.H.1
Pan, H.2
Grigoropoulos, C.P.3
Luscombe, C.K.4
Frechet, J.M.J.5
Poulikakos, D.6
-
21
-
-
36148965547
-
-
P. Kanninen, C. Johans, J. Merta, and K. Kontturi, J. Coll. Interf. Sci. 318, 88 (2008).
-
(2008)
J. Coll. Interf. Sci.
, vol.318
, pp. 88
-
-
Kanninen, P.1
Johans, C.2
Merta, J.3
Kontturi, K.4
-
22
-
-
34247474794
-
-
S. M. Bidoki, D. M. Lewis, M. Clark, A. Vakorov, P. A. Millner, and D. McGorman, J. Micromech. Microeng. 17, 967 (2007).
-
(2007)
J. Micromech. Microeng.
, vol.17
, pp. 967
-
-
Bidoki, S.M.1
Lewis, D.M.2
Clark, M.3
Vakorov, A.4
Millner, P.A.5
McGorman, D.6
-
23
-
-
33750622924
-
-
X. Xia, C. Xie, S. Cai, Z. Yang, and X. Yang, Corros. Sci. 48, 3924 (2006).
-
(2006)
Corros. Sci.
, vol.48
, pp. 3924
-
-
Xia, X.1
Xie, C.2
Cai, S.3
Yang, Z.4
Yang, X.5
-
24
-
-
84883767231
-
-
A description of characteristics of printable fluids for the Dimatix DMP-2800 inkjet printer can be found at
-
A description of characteristics of printable fluids for the Dimatix DMP-2800 inkjet printer can be found at: http://www. fujifilmusa. com/products/industrial_inkjet_printheads/deposition-products/dmp-2800/index. html.
-
-
-
-
25
-
-
84865800473
-
-
C. Kim, M. Nogi, K. Suganuma, Y. Saitou, and J. Shirakami, RSC Adv. 2, 8447 (2012).
-
(2012)
RSC Adv.
, vol.2
, pp. 8447
-
-
Kim, C.1
Nogi, M.2
Suganuma, K.3
Saitou, Y.4
Shirakami, J.5
-
26
-
-
34648836320
-
-
K. P. Latti, M. Kettunen, J. P. Stoem, and P. Silventoinen, IEEE T. Instrum. Meas. 56, 1845 (2007).
-
(2007)
IEEE T. Instrum. Meas.
, vol.56
, pp. 1845
-
-
Latti, K.P.1
Kettunen, M.2
Stoem, J.P.3
Silventoinen, P.4
-
27
-
-
84883815915
-
-
San Francisco, CA USA: IMTC, IEEE Inst. Elec. Electron. Eng. Inc
-
D. Markovic, B. Jokanovic, M. Marjanovic, and M. Djordjevic, Instrument. Measurement Technol Conf. Proc. p. 1, IMTC, IEEE Inst. Elec. Electron. Eng. Inc., San Francisco, CA USA (2007).
-
(2007)
Instrument. Measurement Technol Conf. Proc.
, pp. 1
-
-
Markovic, D.1
Jokanovic, B.2
Marjanovic, M.3
Djordjevic, M.4
-
30
-
-
0030704511
-
-
R. W. Pekala, R. A. Schwarz, R. G. Swisher, R. C. Wang, R. O. Ondeck, and M. O. Okoroafor, Polym. Mater. Sci. Eng. 76, 593 (1997).
-
(1997)
Polym. Mater. Sci. Eng.
, vol.76
, pp. 593
-
-
Pekala, R.W.1
Schwarz, R.A.2
Swisher, R.G.3
Wang, R.C.4
Ondeck, R.O.5
Okoroafor, M.O.6
-
31
-
-
0028336573
-
-
W. J. Dressick, C. S. Dulcey, J. H. Georger, Jr., G. S. Calabrese, and J. M Calvert, J. Electrochem. Soc. 141, 210 (1994).
-
(1994)
J. Electrochem. Soc.
, vol.141
, pp. 210
-
-
Dressick, W.J.1
Dulcey, C.S.2
Georger Jr., J.H.3
Calabrese, G.S.4
Calvert, J.M.5
-
32
-
-
0001909274
-
-
M. Charbonnier, M. Romand, G. Stremsdoerfer, and A. Fares-Karam, Recent Res. Dev. Macromol. Res. 4, 27 (1999).
-
(1999)
Recent Res. Dev. Macromol. Res.
, vol.4
, pp. 27
-
-
Charbonnier, M.1
Romand, M.2
Stremsdoerfer, G.3
Fares-Karam, A.4
-
34
-
-
0038276992
-
-
L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films434, 121 (2003).
-
(2003)
Thin Solid Films
, vol.434
, pp. 121
-
-
Xu, L.1
Liao, J.2
Huang, L.3
Ou, D.4
Guo, Z.5
Zhang, H.6
Ge, C.7
Gu, N.8
Liu, J.9
-
35
-
-
59249093201
-
-
Z. Bao, E. M. Ernst, S. Yoo, and K. H. Sandhage, Adv. Mater. 21, 474 (2009).
-
(2009)
Adv. Mater.
, vol.21
, pp. 474
-
-
Bao, Z.1
Ernst, E.M.2
Yoo, S.3
Sandhage, K.H.4
-
36
-
-
84855412616
-
-
Y. Fang, Y. D. Berrigan, Y. Cai, S. R. Marder, and K. H. Sandhage, J. Mater. Chem. 22, 1305 (2012).
-
(2012)
J. Mater. Chem.
, vol.22
, pp. 1305
-
-
Fang, Y.1
Berrigan, Y.D.2
Cai, Y.3
Marder, S.R.4
Sandhage, K.H.5
-
37
-
-
84883806624
-
-
Gaithersburg, MD USA: NIST
-
J. Baker-Jarvis, B. Riddle, and M. Janezic, NIST Tech. Rept. No. 1512, NIST, Gaithersburg, MD USA (1999).
-
(1999)
NIST Tech. Rept. No. 1512
-
-
Baker-Jarvis, J.1
Riddle, B.2
Janezic, M.3
|