Helium focused ion beam fabricated plasmonic antennas with sub-5 nm gaps

Nanotechnology

Volumn 24, Issue 39, 2013, Pages

  Scholder, Olivier ^a   Jefimovs, Konstantins ^a   Shorubalko, Ivan ^a   Hafner, Christian ^b   Sennhauser, Urs ^a   Bona, Gian Luca ^a,b  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

FABRICATION METHOD; FINITE ELEMENT SIMULATIONS; FOCUSED ION BEAM MILLING; REFRACTIVE INDEX SENSITIVITY; REFRACTIVE INDEX UNITS; REPRODUCIBILITIES; RESONANCE WAVELENGTHS; SCATTERING SPECTRA;

ANTENNAS; ELECTRON BEAM LITHOGRAPHY; FOCUSED ION BEAMS; HELIUM; NANORODS; REFRACTIVE INDEX;

PLASMONS;

EID: 84883765751     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/39/395301     Document Type: Article

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