TEM study of (110)-type 35.26° dislocations specially induced by polishing of SrTiO3 single crystals

Ultramicroscopy

Volumn 134, Issue , 2013, Pages 77-85

  Jin, L ^a   Guo, X ^a,b   Jia, C L ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

(110) type 35.26 dislocation; (Scanning) transmission electron microscopy; Faulted dipole; Glide dissociation; Strontium titanate

Indexed keywords

ATOMIC RESOLUTION IMAGES; CORE STRUCTURE; CROSS-CORRELATION ANALYSIS; DENSITY OF DISLOCATION; EXPERIMENTAL EVIDENCE; FAULTED DIPOLE; MECHANICAL POLISHING; SURFACE LAYERS;

DISSOCIATION; ELECTRIC PROPERTIES; POLISHING; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES;

STRONTIUM TITANATES;

PEROVSKITE; STRONTIUM TITANATE; UNCLASSIFIED DRUG; OXIDE; STRONTIUM; STRONTIUM TITANIUM OXIDE; TITANIUM;

ARTICLE; CORRELATION ANALYSIS; CROSS CORRELATION ANALYSIS; CRYSTAL STRUCTURE; DENSITY; DISSOCIATION; HIGH ANGLE ANNULAR DARK FIELD IMAGING; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE ANALYSIS; PARAMETERS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; WEAK BEAM DARK FIELD IMAGING; 〈 110〉 -TYPE 35.26° DISLOCATION; (SCANNING) TRANSMISSION ELECTRON MICROSCOPY; CHEMISTRY; CRYSTALLIZATION; FAULTED DIPOLE; GLIDE DISSOCIATION; METHODOLOGY; PROCEDURES;

〈 110〉 -TYPE 35.26° DISLOCATION; (SCANNING) TRANSMISSION ELECTRON MICROSCOPY; FAULTED DIPOLE; GLIDE DISSOCIATION; STRONTIUM TITANATE;

CRYSTALLIZATION; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; MICROSCOPY, ELECTRON, TRANSMISSION; OXIDES; STRONTIUM; TITANIUM;

EID: 84883558852     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.06.009     Document Type: Article

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