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Volumn 5, Issue 9, 2013, Pages 2595-2598

Atomic resolution analysis of microporous titanosilicate ETS-10 through aberration corrected STEM Imaging

Author keywords

Catalysis; Electron microscopy; Molecular sieves

Indexed keywords

ABERRATION-CORRECTED STEM; ATOMIC RESOLUTION; ATOMIC RESOLUTION IMAGES; HIGH RESOLUTION IMAGE; MICROPOROUS TITANOSILICATE ETS-10; MULTIPLE DEFECTS; SPHERICAL ABERRATIONS;

EID: 84883543997     PISSN: 18673880     EISSN: 18673899     Source Type: Journal    
DOI: 10.1002/cctc.201300045     Document Type: Article
Times cited : (29)

References (30)
  • 4
    • 84883550275 scopus 로고
    • US Patent 4 853202
    • S. M. Kuznicki, US Patent 4 853202, 1989;
    • (1989)
    • Kuznicki, S.M.1
  • 5
    • 84883499041 scopus 로고
    • US Patent 4 938989
    • S. M. Kuznicki, US Patent 4 938989, 1990.
    • (1990)
    • Kuznicki, S.M.1
  • 29
    • 84883527096 scopus 로고    scopus 로고
    • http://www.hremresearch.com.
  • 30
    • 84883548983 scopus 로고    scopus 로고
    • C.T. Koch, Determination of Core Structure Periodicity and Point Defect Density Along Dislocations, Ph.D. thesis, Arizona State University, 2002.
    • C.T. Koch, Determination of Core Structure Periodicity and Point Defect Density Along Dislocations, Ph.D. thesis, Arizona State University, 2002.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.