An approach to reliability assessment under degradation and shock process

IEEE Transactions on Reliability

Volumn 60, Issue 4, 2011, Pages 852-863

  Wang, Zhonglai ^a   Huang, Hong Zhong ^a   Li, Yanfeng ^a   Xiao, Ning Cong ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

A fixed time period; degradation process; reliability analysis; shocks; varying time periods

Indexed keywords

BINARY STATE; CONTINUOUS PROCESS; DEGRADATION PROCESS; FAILURE RATE; FIXED TIME; PRODUCT PERFORMANCE; RELIABILITY ASSESSMENTS; RELIABILITY EQUATIONS; SHOCKS; TIME-PERIODS;

DEGRADATION;

RELIABILITY ANALYSIS;

EID: 82455164078     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2011.2170254     Document Type: Article

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