메뉴 건너뛰기




Volumn 33, Issue 4, 2013, Pages 35-45

Active guardband management in power7+ to save energy and maintain reliability

Author keywords

Critical path; Design; Digital phase lock loop; Energy efficient; Experimentation; Measurement; Performance; Performance and reliability; Power7+; Reliability; Timing margin; Voltage speculation

Indexed keywords

CRITICAL PATHS; DIGITAL PHASE-LOCK LOOPS; ENERGY EFFICIENT; EXPERIMENTATION; PERFORMANCE; PERFORMANCE AND RELIABILITIES; POWER7; TIMING MARGIN;

EID: 84883324967     PISSN: 02721732     EISSN: None     Source Type: Journal    
DOI: 10.1109/MM.2013.52     Document Type: Article
Times cited : (56)

References (4)
  • 1
    • 84858769317 scopus 로고    scopus 로고
    • Active management of timing guardband to save energy in POWER7
    • C. Lefurgy et al., Active Management of Timing Guardband to Save Energy in POWER7, Proc. 44th Ann. Intl Symp. Microarchitecture, ACM, 2011, pp. 1-11.
    • (2011) Proc. 44th Ann. Intl Symp Microarchitecture, ACM , pp. 1-11
    • Lefurgy, C.1
  • 2
    • 34548854756 scopus 로고    scopus 로고
    • A distributed critical-path timing monitor for a 65nm high-performance microprocessor
    • A. Drake et al., A Distributed Critical-Path Timing Monitor for a 65nm High-Performance Microprocessor, Proc. Intl Solid-State Circuits Conf. (ISSCC 07), IEEE, 2007, pp. 398- 399.
    • (2007) Proc. Intl Solid-State Circuits Conf. (ISSCC 07), IEEE , pp. 398-399
    • Drake, A.1
  • 3
    • 79955366638 scopus 로고    scopus 로고
    • Introducing the adaptive energy management features of the power7 chip
    • Mar./Apr.
    • M. Floyd et al., Introducing the Adaptive Energy Management Features of the Power7 Chip, IEEE Micro, Mar./Apr. 2011, pp. 60-75.
    • (2011) IEEE Micro , pp. 60-75
    • Floyd, M.1
  • 4
    • 85008054348 scopus 로고    scopus 로고
    • A wide power supply range wide tuning range all static CMOS all digital PLL in 65 nm SOI
    • Jan.
    • J.A. Tierno, A.V. Rylyakov, and D.J. Friedman, A Wide Power Supply Range, Wide Tuning Range, All Static CMOS All Digital PLL in 65 nm SOI, IEEE J. Solid-State Circuits, Jan. 2008, pp. 42-51.
    • (2008) IEEE J. Solid-State Circuits , pp. 42-51
    • Tierno, J.A.1    Rylyakov, A.V.2    Friedman, D.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.