Growth morphology of Pb films on Ni3Al(111)

Vacuum

Volumn 101, Issue , 2014, Pages 71-78

  Miskow K ^a,b,c   Krupski, A ^a,b,c   Wandelt, K ^b,c  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b UNIVERSITY OF BONN   (Germany)

^c UNIVERSITY OF WROC AW   (Poland)

Author keywords

Alumina; Aluminium; Auger electron spectroscopy (AES); Crystal growth; Crystalline structure; Lead; Low index single crystal surface; Metal metal interfaces; Nickel; Scanning tunnelling microscopy (STM); Thin film growth

Indexed keywords

AUGER ELECTRON SPECTROSCOPIES (AES); CRYSTALLINE STRUCTURE; HEXAGONAL ISLANDS; LOW INDEX SINGLE CRYSTALS; METAL-METAL INTERFACES; STRANSKI-KRASTANOV GROWTH MODE; THREE-DIMENSIONAL GROWTH; TWO-DIMENSIONAL GROWTH; GROWTH MORPHOLOGY; LOW INDEX SINGLE CRYSTAL SURFACES;

ALUMINA; ALUMINUM; ATOMS; AUGER ELECTRON SPECTROSCOPY; CRYSTAL GROWTH; ELECTRONS; EPITAXIAL GROWTH; FILM GROWTH; LEAD DEPOSITS; LOW ENERGY ELECTRON DIFFRACTION; MONOLAYERS; MORPHOLOGY; NICKEL; SCANNING TUNNELING MICROSCOPY; THIN FILMS; WETTING; AUGERS; CRYSTAL STRUCTURE; ELECTRON SPECTROSCOPY; INTERFACES (MATERIALS); LEAD;

LEAD; FILM GROWTH;

EID: 84883193816     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2013.07.022     Document Type: Article

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