Multiple view image analysis of freefalling U.S. wheat grains for damage assessment

Computers and Electronics in Agriculture

Volumn 98, Issue , 2013, Pages 62-73

  Delwiche, Stephen R ^a   Yang, I Chang ^b   Graybosch, Robert A ^c  

^a AGRICULTURAL RESEARCH SERVICE   (United States)

^b National Science Council   (Taiwan)

^c AGRICULTURAL RESEARCH SERVICE   (United States)

Author keywords

Damage; Elliptic Fourier Descriptor; Imaging; Morphology; Texture; Wheat

Indexed keywords

CONTENT BASED RETRIEVAL; DAMAGE DETECTION; DATA ACQUISITION; FEATURE EXTRACTION; FOURIER SERIES; IMAGE SEGMENTATION; IMAGING TECHNIQUES; MATHEMATICAL MODELS; MORPHOLOGY; TEXTURES;

DAMAGE; ELLIPTIC FOURIER DESCRIPTOR; ELLIPTIC FOURIER DESCRIPTORS; GRAY-LEVEL CO-OCCURRENCE MATRIX; HIGH-SPEED DIGITAL IMAGING; LINEAR DISCRIMINANT ANALYSIS; TRUNCATED FOURIER SERIES; WHEAT;

GRAIN (AGRICULTURAL PRODUCT);

ACCURACY ASSESSMENT; DIGITAL IMAGE; HARVESTING; IMAGE ANALYSIS; IMAGE CLASSIFICATION; IMAGING METHOD; MORPHOLOGY; TEXTURE; VIEW; WHEAT;

UNITED STATES;

TRITICUM AESTIVUM;

EID: 84883010847     PISSN: 01681699     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.compag.2013.07.002     Document Type: Article

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