Identification of damaged kernels in wheat using a colour machine vision system

Journal of Cereal Science

Volumn 30, Issue 1, 1999, Pages 49-59

  Luo, X ^a   Jayas, D S ^a   Symons, S J ^b  

^a UNIVERSITY OF MANITOBA   (Canada)

^b GRAIN RESEARCH LABORATORY   (Canada)

Author keywords

Classification; Grading; Grain; Inspection; Machine vision; Quality

Indexed keywords

TRITICUM AESTIVUM;

EID: 0003130349     PISSN: 07335210     EISSN: None     Source Type: Journal    
DOI: 10.1006/jcrs.1998.0240     Document Type: Article

References (20)

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