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Surface and Interface Analysis

Volumn 44, Issue 11-12, 2012, Pages 1538-1541

Thickness contrast of few-layered graphene in SEM

(3) Park, Min Ho a Kim, Tae Hoon a Yang, Cheol Woong a

a Sungkyunkwan University (South Korea)

Author keywords

Graphene; SEM; Thickness contrast; Work function

Indexed keywords

SCANNING ELECTRON MICROSCOPY; SILICA; SILICON; WORK FUNCTION;

ACCELERATION VOLTAGES; GRAPHENE LAYERS; PRIMARY ELECTRONS; SECONDARY ELECTRONS; SEM IMAGE; THICKNESS CONTRAST; THICKNESS VARIATION;

GRAPHENE;

EID: 84882453778 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.4995 Document Type: Conference Paper

Times cited : (38)

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