Investigation of electrically induced migration of copper on graphene surfaces: Theory and experiments

Applied Physics Letters

Volumn 103, Issue 7, 2013, Pages

  Wang, Tao ^a   Yu, Bin ^b   Liu, Yan ^c   Jamal Deen, M ^d  

^a ZHEJIANG UNIVERSITY   (China)

^b STATE UNIVERSITY OF NEW YORK   (United States)

^c ZHEJIANG UNIVERSITY SCHOOL OF MEDICINE   (China)

^d MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CU ATOMS; GRAPHENE DEVICES; NANO SCALE; PHYSICAL ADSORPTION;

ADSORPTION; COPPER; ELECTRIC FIELDS; EXPERIMENTS; GRAPHENE; VAN DER WAALS FORCES;

ATOMS;

EID: 84882410125     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4818120     Document Type: Article

References (18)

1. Y. M. Lin, C. Dimitrakopoulos, K. A. Jenkins, D. B. Farmer, and H. Y. Chiu, Science 327 (5966), 662 (2010). 10.1126/science.1184289
2. Y. Wu, K. A. Jenkins, A. Valdes-Garcia, D. B. Farmer, Y. Zhu, A. A. Bol, C. Dimitrakopoulos, W. Zhu, F. Xia, P. Avouris, and Y.-M. Lin, Nano Lett. 12 (6), 3062-3067 (2012). 10.1021/nl300904k
3. Y.-M. Lin, H.-Y. Chiu, K. A. Jenkins, D. B. Farmer, P. Avouris, and A. Valdes-Garcia, IEEE Electron Device Lett. 31, 68-70 (2010). 10.1109/LED.2009. 2034876
4. X. Du, I. Skachko, A. Barker, and E. Y. Andrei, Nat. Nanotechnol. 3 (8), 491-495 (2008). 10.1038/nnano.2008.199
5. A. A. Balandin, S. Ghosh, W. Bao, I. Calizo, D. Teweldebrhan, F. Miao, and C. N. Lau, Nano Lett. 8 (3), 902-907 (2008). 10.1021/nl0731872
6. A. Naeemi and J. D. Meindl, IEEE Electron Device Lett. 28 (5), 428-431 (2007). 10.1109/LED.2007.895452
7. P. G. Collins, M. Hersam, M. Arnold, R. Martle, and P. Avouris, Phys. Rev. Lett. 86 (14), 3128-3131 (2001). 10.1103/PhysRevLett.86.3128
8. M. Suzuki, Y. Ominami, Q. Ngo, and C. Y. Yang, J. Appl. Phys. 101 (11), 114307 (2007). 10.1063/1.2743086
9. R. Murali, Y. Yang, K. Brenner, T. Beck, and J. D. Meindl, Appl. Phys. Lett. 94, 243114 (2009). 10.1063/1.3147183
10. M. Vanin, J. J. Mortensen, A. K. Kelkkanen, J. M. Garcia-Lastra, K. S. Thygesen, and K. W. Jacobsen, Phys. Rev. B 81, 081408 (2010). 10.1103/PhysRevB.81.081408
11. L. Gao, J. R. Guest, and N. P. Guisinger, Nano Lett. 10, 3512-3516 (2010). 10.1021/nl1016706
12. J. Maassen, W. Ji, and H. Guo, Appl. Phys. Lett. 97, 142105 (2010). 10.1063/1.3496490
13. M. Wu, E.-Z. Liu, M. Y. Ge, and J. Z. Jiang, Appl. Phys. Lett. 94, 102505 (2009). 10.1063/1.3097013
14. M. J. Deen and P. K. Basu, Silicon Photonics-Fundamentals and Devices, (John Wiley Sons, Ltd., 2012).
15. B. Delley, J. Chem. Phys. 113 (18), 7756 (2000). 10.1063/1.1316015
16. B. Hammer, L. B. Hanse, and J. K. Norskov, Phys. Rev. B 59 (11), 7413-7421 (1999). 10.1103/PhysRevB.59.7413
17. A. C. Ferrari, J. C. Meyer, V. Scardaci, C. Casiraghi, M. Lazzeri, F. Mauri, S. Piscanec, D. Jiang, K. S. Novoselov, S. Roth, and A. K. Geim, Phys. Rev. Lett. 97 (18), 187401 (2006). 10.1103/PhysRevLett.97.187401
18. R. Varns and P. Strange, J. Phys.: Condens. Matter 20 (22), 225005 (2008). 10.1088/0953-8984/20/22/225005