Optomechanical effects of two-level systems in a back-action evading measurement of micro-mechanical motion

Applied Physics Letters

Volumn 103, Issue 5, 2013, Pages

  Suh, J ^a   Weinstein, A J ^a   Schwab, K C ^a  

^a California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN STRATEGIES; ELECTROMECHANICAL SYSTEMS; MECHANICAL RESONANCE; MICROWAVE RESONANCE; NON-LINEAR RESPONSE; PARAMETRIC INSTABILITIES; QUANTUM NONDEMOLITION MEASUREMENTS; SUPERCONDUCTING CIRCUIT;

COUPLED CIRCUITS; MICROWAVE DEVICES;

SEEBECK EFFECT;

EID: 84882390272     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4816428     Document Type: Article

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