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Volumn 8, Issue 1, 2013, Pages 1-5

Optical visualization of ultrathin mica flakes on semitransparent gold substrates

Author keywords

Conductive AFM; Metallic substrate; Optical microscopy; Ultrathin layers

Indexed keywords

ATOMIC FORCE MICROSCOPY; GEOMETRICAL OPTICS; GOLD; MICA; OPTICAL MICROSCOPY; VISUALIZATION;

EID: 84881225239     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-8-305     Document Type: Article
Times cited : (9)

References (14)
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    • Low CG, Zhang Q: Ultra-thin and flat mica as gate dielectric layers. Small 2012, 8:2178-2183.
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    • Low, C.G.1    Zhang, Q.2
  • 7
    • 2942744779 scopus 로고    scopus 로고
    • Electronic color charts for dielectric films on silicon
    • Henrie J, Kellis S, Schultz S, Hawkins A: Electronic color charts for dielectric films on silicon. Opt Express 2004, 12:1464-1469.
    • (2004) Opt Express , vol.12 , pp. 1464-1469
    • Henrie, J.1    Kellis, S.2    Schultz, S.3    Hawkins, A.4
  • 8
    • 0001471062 scopus 로고    scopus 로고
    • Uniformly flat gold surfaces: Imaging the domain structure of organic monolayers using scanning force microscopy
    • Stamou D, Gourdon D, Liley M, Burnham NA, Kulik A, Vogel H, Duschl C: Uniformly flat gold surfaces: imaging the domain structure of organic monolayers using scanning force microscopy. Langmuir 1997, 13:2425-2428.
    • (1997) Langmuir , vol.13 , pp. 2425-2428
    • Stamou, D.1    Gourdon, D.2    Liley, M.3    Burnham, N.A.4    Kulik, A.5    Vogel, H.6    Duschl, C.7
  • 9
    • 36048991244 scopus 로고    scopus 로고
    • Electron transport through supported biomembranes at the nanoscale by conductive atomic force microscopy
    • Casuso I, Fumagalli L, Samitier J, Padrós E, Reggiani L, Akimov V, Gomila G: Electron transport through supported biomembranes at the nanoscale by conductive atomic force microscopy. Nanotechnology 2007, 18:465503.
    • (2007) Nanotechnology , vol.18 , pp. 465503
    • Casuso, I.1    Fumagalli, L.2    Samitier, J.3    Padrós, E.4    Reggiani, L.5    Akimov, V.6    Gomila, G.7
  • 14
    • 80052199048 scopus 로고    scopus 로고
    • Thickness determination of graphene on metal substrate by reflection spectroscopy
    • Kaplas T, Zolotukhin A, Svirko Y: Thickness determination of graphene on metal substrate by reflection spectroscopy. Y Opt Exp 2011, 19:17227-17231.
    • (2011) Y Opt Exp , vol.19 , pp. 17227-17231
    • Kaplas, T.1    Zolotukhin, A.2    Svirko, Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.