Reliability comparison of a dual boost and a triangular current mode resonant-transition pfc converter topology

2012 7th International Conference on Integrated Power Electronics Systems, CIPS 2012

Volumn , Issue , 2012, Pages

  Allemann, S ^a   Biela, J ^a   Held, M ^b  

^a ETH ZURICH   (Switzerland)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CONVERTER DESIGN; HIGHER EFFICIENCY; PREDICTION MODEL; RELIABILITY COMPARISONS; SOFT-SWITCHED CONVERTERS; SYSTEM RELIABILITY; TELECOM APPLICATIONS; TRIANGULAR CURRENT;

RELIABILITY;

ELECTRIC RECTIFIERS;

EID: 84881086144     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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2. H. Ye, Z. Yang, J. Dai, C. Yan, X. Xin, and J. Ying, "Common Mode Noise Modeling and Analysis of Dual Boost PFC Circuit," Intelec, 2004.
3. J. Biela, J. W. Kolar, and G. Deboy, "Optimal Design of a Compact 99.3% Efficient Single-Phase PFC Rectifier," Applied Power Electronics Conference and Exposition, Februar 2010.
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9. M. S. Cooper, "Investigation of Arrhenius Acceleration Factor for Integrated Circuit Early Life Failure Region With Several Failure Mechanisms," IEEE Transactions on Components and Packaging Technologies, vol. 28, 2005.