Investigation of Arrhenius acceleration factor for integrated circuit early life failure region with several failure mechanisms

IEEE Transactions on Components and Packaging Technologies

Volumn 28, Issue 3, 2005, Pages 561-563

  Cooper, Mark Spencer ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Arrhenius activation energy; Arrhenius equation; Infant mortality failure characteristics; Mixed population failure mechanisms; Weibull distribution

Indexed keywords

ACTIVATION ENERGY; FAILURE (MECHANICAL); LIFE CYCLE; MATHEMATICAL MODELS; RELIABILITY; THERMAL EFFECTS; WEIBULL DISTRIBUTION;

ARRHENIUS ACTIVATION ENERGY; ARRHENIUS EQUATION; INFANT MORTALITY FAILURE CHARACTERISTICS; LIFE FAILURE REGION; MIXED POPULATION FAILURE MECHANISMS;

INTEGRATED CIRCUIT TESTING;

EID: 27644545562     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2005.848581     Document Type: Article

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